Combined Focused Ion Beam-Scanning Electron Microscopes

Combined Focused Ion Beam-Scanning Electron Microscopes

Combined focused ion beam-scanning electron microscopes are microscopy systems that combine the capabilities of scanning electron and focused ion beam microscopy techniques. Products are suitable for life sciences, material science, and various other research or industry applications.
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Helios™ NanoLab™ 1200AT DualBeam™ for Semiconductors Thermo Scientific™

Thermo Scientific™ Helios™ NanoLab 1200AT DualBeam™ can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter.

Helios 5 PFIB UXe DualBeam Thermo Scientific™

Thermo Scientific™ Helios 5 PFIB UXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB UXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.

Helios 5 UX DualBeam for Materials Science Thermo Scientific™

The Thermo Scientific™ Helios™ 5 UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...

Helios G4 UC DualBeam for Semiconductors Thermo Scientific™

Scientists and engineers constantly face new challenges that require highly localized characterization of increasingly complex samples with ever smaller features. The latest technological innovations of the Thermo Scientific™ Helios™ G4 UC DualBeam™ microscope, in combination with the easiest to...

Helios 5 Hydra CX DualBeam Thermo Scientific™

The Thermo Scientific™ Helios 5 Hydra CX DualBeam is part of the fourth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...

Scios™ 2 DualBeam™ for Materials Science Thermo Scientific™

The Thermo Scientific™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.

Helios 5 PXL PFIB Wafer DualBeam Thermo Scientific™

PFIB SEM for in-line metrology and process monitoring of advanced 3D NAND and DRAM devices.

Helios™ G4 PFIB HXe DualBeam™ for Semiconductors Thermo Scientific™

The Thermo Scientific™ Helios™ G4 PFIB HXe DualBeam System provides unique capabilities to enable damage-free delayering of 10nm semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications.

Helios 5 PFIB CXe DualBeam Thermo Scientific™

Thermo Scientific™ Helios 5 PFIB CXe delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios 5 PFIB CXe is part of the fifth generation of the industry-leading Helios DualBeam™ family.

Helios™ G4 FX DualBeam™ for Semiconductors Thermo Scientific™

The Thermo Scientific™ Helios™ G4 FX DualBeam™ microscope is Thermo Fisher Scientific's most advanced failure analysis DualBeam platform, capable of creating high-quality, ultra-thin TEM lamellae for 7nm process development and ramp.

Helios G4 UX DualBeam for Semiconductors Thermo Scientific™

The latest technological innovations of the Thermo Scientific™ Helios™ G4 DualBeam™, in combination with the easiest to use, most comprehensive software and Thermo Fisher Scientific's application expertise, allow for the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples...

Helios G4 CX DualBeam for Semiconductors Thermo Scientific™

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The latest technological innovations of the Thermo Scientific™ Helios™ G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and...

Helios 5 UC DualBeam for Materials Science Thermo Scientific™

The Thermo Scientific™ Helios™ 5 UC DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme...

Helios™ G4 HX DualBeam™ for Semiconductors Thermo Scientific™

The Thermo Scientific™ Helios™ G4 HX DualBeam™ microscope replaces the highly successful Helios 460HP as the industry’s highest throughput, dedicated transmission electron microscope (TEM) lamella preparation platform.

Helios 5 CX DualBeam for Materials Science Thermo Scientific™

The Thermo Scientific™ Helios™ 5 CX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column for ultra high-resolution imaging and the highest...
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