Focused Ion Beam Electron Microscopes

A plasma focused ion beam scanning electron microscope (plasma-FIB SEM) combines improved sputtering efficiency with nanometer imaging resolution at either room temperature or under cryogenic conditions. This provides a fast way to capture large specimen volumes.

Scientists and engineers in both academia and industry are constantly facing new challenges that require highly localized characterization of a wide range of samples and materials. The ongoing drive to improve the quality of these materials means that structural and compositional information at the...