Transmission Electron Microscopes

Transmission Electron Microscopes

TEM microscopes provide highly magnified, high-resolution images via the passing of electrons through samples under examination. This facilitates the capture of detail thousands of times finer than that achievable with a light microscope.
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Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.
Talos™ F200X G2 TEM Thermo Scientific™
The Thermo Scientific™ Talos™ F200X is a scanning transmission electron microscope (S)TEM that combines outstanding high-resolution (S)TEM and TEM imaging with energy dispersive X-ray spectroscopy (EDS) signal detection.
Find additional information here: Thermo Scientific™ Talos™ L120C transmission electron microscope (TEM) Discover the next generation 120kV imaging platform. Key features of the Thermo Scientific™ Talos™ L120C transmission electron microscope (TEM) include modular design and improved optical...
Find additional information here: Thermo Scientific™ Krios™ G4 Cryo Transmission Electron Microscope (Cryo-TEM) The new Thermo Scientific™ Krios™ G4 Cryo Transmission Electron Microscope (Cryo-TEM) enables you to unravel life at the molecular level—easier, faster and more reliably than ever before.
The Thermo Scientific™ Themis™ ETEM builds on the proven Titan ETEM concept-combining both standard S/TEM and dedicated environmental TEM capabilities for time-resolved, in situ studies of the dynamic behavior of nanomaterials.
As the fastest and most reliable instrument in its class, the Thermo Scientific™ Spectra 300 Scanning/Transmission Electron Microscope (S/TEM) provides unprecedented performance for the study of semiconductor materials and semiconductor failure analysis.
Talos F200E TEM Thermo Scientific™
The Thermo Scientific Talos F200E (Scanning) Transmission Electron Microscope provides high-resolution STEM and TEM imaging with minimal distortion, combined with high-throughput energy-dispersive X-ray spectroscopy (EDS) functionality, tailored for a wide range of semiconductor defect analysis and...
Find additional information here: Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) The Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete solution for high resolution, high throughput macromolecular structure...
Talos™ F200i TEM Thermo Scientific™
The Thermo Scientific™ Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications.
Metrios 6 (S)TEM Thermo Scientific™
(S)TEM reference metrology for the semiconductor industry. The Metrios (S)TEM offers fully automated reference metrology for enhanced throughput, repeatability, and scalability in high-volume semiconductor analysis. Find out more about Metrios 6 (S)TEM
The Thermo Scientific™ Metrios™ AX S/TEM is a 60–200 kV scanning/transmission electron microscope (S/TEM), designed from the ground up to deliver repeatable TEM- and STEM-based imaging, analytics and gauge capable metrology results at an unprecedented throughput level.
Advanced logic and memory manufacturing processes are becoming more reliant on fast turnaround of precise structural and analytical data to be able to quickly calibrate tool sets, diagnose yield excursions, and optimize process yields.
The new, fully integrated, and advanced Thermo Scientific Iliad (S)TEM features the new Iliad EELS Spectrometer and Energy Filter with the dedicated Zebra camera as well as the NanoPulser, our new electrostatic beam blanker.
The Thermo Scientific™ Talos™ F200C transmission electron microscope (TEM) is a powerful, versatile system for delivering 3D characterization of biological and biomaterials samples in cell biology, structural biology, and nanotechnology research.
The Thermo Scientific™ Talos™ F200S scanning/transmission electron microscope(S/TEM) combines outstanding high-resolution S/TEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS).
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Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample’s thickness/density, composition and, in some cases, crystallinity.
Our full cryo-TEM portfolio features state-of-the-art technology with a range of automation features designed to extend accessibility, reduce the need for user intervention, and enableeasy organization, viewing, and sharing data.
Documents & Support (91)
Use of an Environmental Transmission Electron Microscope for Dynamic in situ Studies of Nano-Structured Materials at the Atomic Scale