Electron Microscope Accessories | Thermo Fisher Scientific

Electrical Feed-through Sample Holder Thermo Scientific™

The Thermo Scientific™ Electrical Feed-through Sample Holder allows users to connect electrical probes to the sample for in-situ measurements. Six quick release pin connections can be used for various signals to be read and voltages or currents to be applied to the sample simultaneously while the...

Charge Reduction Sample Holder Thermo Scientific™

This sample holder is designed to reduce sample charging and eliminate extra sample preparation of non-conductive samples. Imaging samples such as paper, polymers, organic materials, ceramics, glass and coatings becomes fast and trouble free.

Falcon 4i Direct Electron Detector Thermo Scientific™

The Thermo Scientific Falcon 4i Direct Electron Detector is the ideal solution for your single particle analysis and cryo tomography applications. Find additional information here: Falcon 4i Direct Electron Detector

nProber IV System Thermo Scientific™

The Thermo Scientific nProber IV System is a high-performance scanning-electron-microscopy-based platform for the localization of transistor and metallization faults. It is our most advanced nanoprobing system to date, and the first to use the high-resolution LEEN2 SEM Column.

MAPS Thermo Scientific™

Maps is a modular software application for automated acquisition of high resolution images from large areas, that converts your instrument into a high throughput image data production device.

Velox Thermo Scientific™

The Thermo Scientific™ Velox™ user interface with its integrated design combines the comprehensive access to the microscope optics and detectors to provide superior experimental control for the highest reproducibility, yield and best support for quantitative S/TEM studies in material science.

Hyperion™ System for Semiconductors Thermo Scientific™

The Thermo Scientific™ Hyperion II System offers fast, accurate transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement.

Meridian™ M System for Semiconductors Thermo Scientific™

Thermo Scientific™ Meridian™ M system system uses high sensitivity broadband DBX™ photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. Given results from wafer sort / chip probe, the Meridian M system delivers localization suitable for nanoprobing or...

Temperature Controlled Sample Holder Thermo Scientific™

The Thermo Scientific™ Temperature Controlled Sample Holder has been developed by Thermo Fisher Scientific and Deben in order to study vacuum-sensitive and vulnerable samples such as biological, food or organic coatings.

Athena Software for Core Imaging Facilities Thermo Scientific™

Thermo Scientific Athena Software is a premium imaging data management platform that allows core imaging facilities dedicated to materials science research to simplify their scientific imaging workflows.

Elemental Mapping Thermo Scientific™

The Thermo Scientific™ Elemental Mapping Software is an option within the EID software package (that comes default with the Thermo Scientific™ Phenom™ EDX solution). Elemental mapping reveals the distribution of elements within the sample.

ELITE System Thermo Scientific™

The rapid growth in advanced packaging applications, complex interconnect schemes and higher performance power devices is creating unprecedented failure localization and analysis challenges. Defective or underperforming semiconductor devices often show an anomalous distribution of the local power...

AutoScript TEM Software for Transmission Electron Microscopes Thermo Scientific™

Thermo Scientific AutoScript TEM Software is a scripting environment combining a TEM-specific Python API with the Python editor. Thermo Scientific software packages for electron/ion microscopy, such as Maps Software and Tomography Software for automation and Velox Software for mapping, are great for...

Avizo Software Thermo Scientific™

Avizo Software allows reliable advanced materials properties extraction and characterization in many materials science applications such as energy storage, metals and alloys, composites and polymers, and semiconductors.

Tensile Sample Holder Thermo Scientific™

Thermo Scientific™ Tensile Sample Holder for Thermo Scientific™ Phenom XL. Tensile testing is one of the simplest and most widely used mechanical tests. By measuring the force required to elongate a specimen to breaking point, material properties can be determined that will allow designers and...