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MK.1TE ESD and Static Latch-up Test System Thermo Scientific™

The Thermo Scientific™ MK.1TE ESD and Static Latch-up Test System provides users with advanced capabilities to test midrange pin count devices to today’s Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design ensures recently identified waveform hazards in the standards, such as the trailing pulse and the pre-discharge voltage rise are addressed. Trailing pulses were shown to cause non-ESD related failures by exposing the DUT to an electrical overstress after the main HBM event. Pre-discharge voltage can cause voltage-triggered protection structures to fail, as the pin under test may not be at zero volts when the HBM event occurs. A user-selectable 10K Shunt can be connected during the pulse to eliminate any voltage prior to the actual HBM event. A combination test system, today’s MK.1 test system also performs Static Latch-Up testing per JEDEC’s EIA/JESD 78 method.

ZOOM™ Dual Power Supply (100-120 VAC 47 - 60 Hz) œ Invitrogen™

The ZOOM® Dual Power is a microprocessor-controlled programmable power supply capable of running both high voltage/low current and high current/low voltage applications concurrently. The high voltage/low current section is ideal for sample fractionation, IPG strips, IEF, and DNA sequencing applications. The low voltage/high current section is for SDS-PAGE, native PAGE, second-dimension SDS-PAGE, DNA/RNA electrophoresis, and blotting applications. Four sets of output jacks on each side of the unit allow for multiple apparatus to run simultaneously, offering greater workflow efficiency and higher sample throughput. Some of the important features of the ZOOM® Dual Power unit include:
• High voltage/low current and low voltage/high current sides can be used independently and concurrently
• Multiple output jacks allow for the simultaneous running of up to four electrophoresis apparatus on each side of the unit
• Memory stores up to 30 programs (15 programs per side) of up to six steps per program. Step and ramp functions for discrete and gradual changes of electrical parameters
• No Load detection alarm system can be disabled to power high voltage applications that require very low current

Specifications of the ZOOM® Dual Power
High voltage/Low current output range




Voltage: 1–3500 V; adjustable in 1V steps
Current: 0.01–10.0 mA, adjustable in 0.01 mA increments
Power: 0.1– 35W in 0.1 W steps

Low voltage/High current



output range


Voltage: 1–250 V; adjustable in 1V steps
Current: 1–800 mA, adjustable in 1 mA increments
Power: 1–200 W in 1 W steps

Power Outlets

4 pairs of terminals

Programs Stored

15 programs, up to 6 steps each

Duration Limits

Time: 1 to 9999 min in 1 min steps
Voltage Hours

:

1 to 65000 V-hr in 1 V-hr steps

Operating Modes

Constant voltage, constant current, constant power

Circuit Protection

Open Circuit; Short Circuit; Thermal Protection Over Voltage, Over Current, Over Power

Safety

No Load Detection Enable/Disable Isolated Floating Ground

Memory Control

Non-volatile, up to 24 hours. Custom Methods Stored to RAM

Display

LCD, view area 111.7 x 86mm

Temperature

Ambient 4-40°C

Dimensions

23.5 cm (w) x 34.5 cm (h) x 31 cm (d) (37 cm (d) with power cord attached

Weight

12 kg (26.5 lbs)

Applications for the ZOOM® Dual Power


High voltage/low current


Suggested Applications

• Isoelectric focusing in tube gels
• Isoelectric focusing in IPG strips
• Solution phase isoelectric focusing

Electrophoresis Apparatus:

• ZOOM® IPGRunner™ system
• ZOOM® IEF Fractionators

Low voltage/High current
Suggested Applications

• Blotting applications
• DNA and RNA electrophoresis
• SDS-PAGE
• Native PAGE

Electrophoresis Apparatus:

• XCell SureLock® Mini-Cell
• XCell4 SureLock® Midi-Cell
• XCell6™ Multigel Unit
• XCell II™ Blot Module

Pegasus 2-pin ESD Test System Thermo Scientific™

The Thermo Scientific™ Pegasus™ ESD Test System is a low parasitic 2-pin tester which is used to characterize protection structures at wafer, die, or package level. The Pegasus can also be used as part of your device qualification routine, providing supplemental data to the results gathered when using an automated (relay based) high pin count ESD test system.  Testing is available to the latest industry standards for Human Body Model (HBM), Machine Model (MM) waveforms, as well as offering a true System Level (150pF/330#8486;) IEC like waveform based on the EOS/ESD Association’s Human Metal model (HMM). The system’s pulse source design and pulse source delivery method ensures waveform fidelity directly at the device under test, not only at the generator output. Current waveforms can be automatically captured and analyzed for each ESD event.  In addition, Voltage waveforms can be captured and used to determine the turn-on level of protection structures. They can also be used as a means of failure determination, as the voltage waveforms will generally show changes after ESD events.

Test Fixture Boards Thermo Scientific™

Thermo Scientific™ Test Fixture Boards are custom designed to your devices precise specifications. Years of experience in constructing these boards ensures the highest quality waveforms. Designs can be turned around quickly allowing minimal delays in beginning qualification. All boards are guaranteed to operate correctly or we will repair or replace them free of charge.

Celestron™ TLP/VF-TLP Test System Thermo Scientific™

The Thermo Scientific™ Celestron™ TLP/VF-TLP Test System can be configured for both Standard TLP and VF-TLP for testing at the wafer level and/or package level. Optional probes can also be used to measure signals on pins or pads other than the ones being stressed. The Celestron system software is the most comprehensive in the industry and utilizes graphics to assist in system setup and connection to the DUT. During test operations, it displays the recorded TLP pulse voltage and current waveforms, compiled pulsed I-V curve, leakage current measurements, and DC I-V curve trace data. The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The position and duration of the measurement window within the TLP pulse can also be selected, and modified after the data is collected.

PowerEase™ 300W Power Supply (230 VAC)

The PowerEase® 300W Power Supply is a fully programmable power supply designed for high-throughput gel electrophoresis. The straight-forward, intuitive interface makes the powering of gel runs a simple and easy process. Note: for a 115 VAC version (typically used in North America and Japan), please see Cat. No. PS0300.

In addition, the PowerEase® 300W Power Supply features:

• Constant voltage, current, or power settings
• Built-in timer for walk-away gel electrophoresis
• Up to 10 custom programs with 10 steps each
• Four sets of output jacks that are compatible with most electrophoresis devices

Easy to Use
With the PowerEase® 300W Power Supply, simply set a constant voltage, current, or power to begin a run. This power supply easily accommodates the running and transferring of 8 mini-gels, such as Bolt® Bis-Tris Plus gels, or 16 midi-gels using the XCell4 SureLock™ Midi-Cell.

Programming Capabilities
The PowerEase® 300W Power Supply accommodates up to 10 user-defined programs for your most common electrophoresis runs. Each program can include up to 10 steps, for precise control over the electrophoresis conditions.

MK.2TE ESD and Latch-up Test System Thermo Scientific™

The Thermo Scientific™ MK.2TE ESD and Latch-up Test System provides users with advanced capabilities to test high pin count devices to today’s Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design ensures waveform hazards in the standards, such as the trailing pulse and the pre-discharge voltage rise, are addressed. Trailing pulses have been shown to cause non-ESD related failures by exposing the DUT to an electrical overstress after the main HBM event. Predischarge voltage can cause voltage-triggered protection structures to fail, as the pin under test may not be at zero volts when the HBM event occurs. A user-selectable 10K Shunt can be connected during the pulse to eliminate any voltage prior to the actual HBM event. The MK.2 combination test system also performs Latch-Up testing per the JEDEC EIA/JESD 78 Method. Its enhanced data set features provide the flexibility to meet the testing needs of today’s system-on-chip designs.

MK.4TE ESD and Latch-Up Test System Thermo Scientific™

Thirty years in the making - IC structure designers and QA program managers in manufacturing and test house facilities worldwide have embraced the Thermo Scientific™ MK.4, a versatile, powerful, and flexible, high yield test system. Easily upgradeable, the MK.4 is fully capable of taking your test operations through ever evolving regulatory and quality standards. The advanced rapid relay-based (modular matrix) hardware of the MK.4 is on average ten times faster than mechanically driven ESD testers. The switching matrix, while providing consistent ESD paths, also allows any pin to be grounded, floated, vectored or connected to any of the installed V/I supplies. Furthermore, advanced algorithms ensure accurate switching of HV, in support of pulse source technology, per recent JEDEC/ESDA trailing pulse standards. A powerful, extraordinarily fast embedded VME controller drives the highest Speed-of-Test execution available. Data transfer between the embedded controller and the testers PC server, is handled through TCP/IP communication protocols, minimizing data transfer time. The testers PC server can be accessed through internal networks, as well as through the Internet allowing remote access to the system to determine the systems status or to gather result information

Orion3™ Charged Device Model (CDM) tester Thermo Scientific™

The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production.  Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market).  The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.  

5500 Series Genetic Analyzers UPS (Uninterruptable Power Supply) Applied Biosystems™

This is an Uninterruptible Power Supply (UPS) unit to safeguard the SOLiD 4 and 5500 series Genetic Analysis Systems.

For Research Use Only. Not for use in diagnostics procedures.
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