Achieve research-grade results with the minimum effort. The Thermo Scientific™ K-Alpha™ X-ray Photoelectron Spectrometer (XPS) System is a fully integrated, monochromated small-spot XPS system with depth profiling capabilities. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make the K-Alpha X-ray XPS System ideal for a multi-user environment.
Analyze both soft and hard materials simultaneously with the Thermo Scientific™ MAGCIS™ Dual Beam Ion Source for XPS Instruments. Available on all new Thermo Scientific XPS instruments, the MAGCIS ion source enables depth profiling of soft materials such as polymers using gas cluster ions as well as layers of hard materials such as metals or silicon using monatomic ions. Ideal for the profiling samples such as organic thin films, coatings on fabrics or printed electronics, the MAGCIS dual beam ion source enables the characterization of layered materials in one easy step.
Offer fully automated multi-technique analysis along with high throughput without sacrificing research grade results with the Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System. Integration of multiple analytical techniques like ISS, UPS, REELS and Raman allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development and many other applications.
Collect angle-resolved spectra without the need to tilt the sample to nondestructively characterize ultra-thin layers using the Thermo Scientific™ Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer System.
New and emerging technologies rely on the engineering of the near-surface region of a solid surface. For this type of material, including self-assembled monolayers, surface modified polymers and semiconductor devices, it is essential that the composition of the first few nanometers is known with confidence. The Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer System provides this information using parallel angle resolved XPS (PARXPS) and the advanced software of the Avantage data system, which produces accurate and precise answers.
Meet your demands for increased analytical performance and flexibility with the Thermo Scientific™ ESCALAB™ XI+ X-ray Photoelectron Spectrometer (XPS) Microprobe, which combines high sensitivity with high resolution quantitative imaging and multi-technique capability.