3D Visualization, Analysis and EM Software

3D Visualization, Analysis and EM Software

3D visualization, analysis, and EM software are used to acquire, generate, and analyze imaging data obtained from electron microscopy and related instruments.
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Avizo Software allows reliable advanced materials properties extraction and characterization in many materials science applications such as energy storage, metals and alloys, composites and polymers, and semiconductors.
Maps is a modular software application for automated acquisition of high resolution images from large areas, that converts your instrument into a high throughput image data production device.
With the Thermo Scientific™ 3D Roughness Reconstruction application, the Thermo Scientific™ Phenom™ Desktop SEM systems are able to generate three-dimensional images and submicrometer roughness measurements.
The Thermo Scientific™ Velox™ user interface with its integrated design combines the comprehensive access to the microscope optics and detectors to provide superior experimental control for the highest reproducibility, yield and best support for quantitative S/TEM studies in material science.
Thermo Scientific™ HeliScan™ is an advanced microCT system designed with both helical and circular scanning trajectories to provide universities, research institutes, core laboratories and E&P operators a flexible instrument to meet their specific lab requirements.
: Lock-In IR Thermography system for localization of defects in semiconductor devices. : FIB-SEM. : Down to 20 μm.
With time-to-yield being critical to profitability, it is too costly for advanced foundries, integrated device manufacturers and fabless companies to wait until after dicing and packaging to identify the source of electrical faults.
Thermo Scientific™ NanoBuilder™ is a tool for systematic planning of construction of multi-layer nanostructures by dividing CAD files into ordered projects.
Meridian-IV system is the preferred choice for developers of advanced, low-voltage, high-density semiconductor devices requiring best-in-class performance and the ability to diagnose wide ranging failure modes, including parametric failures and those resulting from design-process marginalities.
The Thermo Scientific Meridian EX System is an innovative electron-beam-based solution for precise defect localization in advanced logic devices. Using groundbreaking e-beam technology, rather than optical (laser), it allows probing through complex wiring networks from the frontside or backside of...
: TEM Software. : 3D electron tomography of materials and biological samples.
From whole-core CT to SEM, Thermo Scientific PerGeos Software is a unique solution for Digital Rock Analysis trusted by Oil & Gas peers. Its visualization, processing, and analysis of 2D and 3D digital rock imagery enables improved evaluation of reservoir quality and faster understanding of static...
Thermo Scientific™ Inspect 3D Software provides a user-friendly solution for alignment of tomographic image series (obtained with transmission electron microscopy or scanning transmission electron microscopy, TEM or STEM) along with energy dispersive X-ray spectroscopy (EDS) maps, producing a 3D...
Thermo Scientific™ TopoMaps Software is a dedicated image visualization, enhancement and analysis solution for Thermo Fisher Scientific Scanning Electron Microscopes and DualBeam systems. Optimize your images, reconstruct features and surfaces in 3D, perform advanced measurements and generate...
The Thermo Scientific™ Hyperion II System offers fast, accurate transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement.
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The Xtra Library provides a collection of add-ons (recipes, scripts, demos) dedicated to specific use cases and workflows, that will help you improve your daily use ofAmira-Avizo Software or PerGeos Software and dramatically increase your efficiency.
Documents & Support (6)
User Bulletin: Celleste System Requirements
Protein Detection on Gels, Blots and Arrays—Section 9.3