The Thermo Scientific™ Velox™ user interface with its integrated design combines the comprehensive access to the microscope optics and detectors to provide superior experimental control for the highest reproducibility, yield and best support for quantitative S/TEM studies in material science.
With time-to-yield being critical to profitability, it is too costly for advanced foundries, integrated device manufacturers and fabless companies to wait until after dicing and packaging to identify the source of electrical faults.
Optimized dynamic LSM platform Performance optical path for best imaging Architecture supports automated test equipment (ATE) docking and back-side (B/S) analysis Mobility for the lab; high power cooling options Best-in-class performance Laser voltage probing (LVP) and laser voltage imaging (LVI)...
Maps is a modular software application for automated acquisition of high resolution images from large areas, that converts your instrument into a high throughput image data production device.
Thermo Scientific™ TopoMaps Software is a dedicated image visualization, enhancement and analysis solution for Thermo Fisher Scientific Scanning Electron Microscopes and DualBeam systems. Optimize your images, reconstruct features and surfaces in 3D, perform advanced measurements and generate...
The Thermo Scientific nProber IV System is a high-performance scanning-electron-microscopy-based platform for the localization of transistor and metallization faults. It is our most advanced nanoprobing system to date, and the first to use the high-resolution LEEN2 SEM Column.
Thermo Scientific™ Amira™ Software is a powerful, universal 2D–5D solution for visualizing, analyzing and understanding life science and biomedical research data from many image modalities, including Optical and Electron Microscopy, CT, MRI and other techniques.
The rapid growth in advanced packaging applications, complex interconnect schemes and higher performance power devices is creating unprecedented failure localization and analysis challenges. Defective or underperforming semiconductor devices often show an anomalous distribution of the local power...
Meridian-IV system is the preferred choice for developers of advanced, low-voltage, high-density semiconductor devices requiring best-in-class performance and the ability to diagnose wide ranging failure modes, including parametric failures and those resulting from design-process marginalities.
The Thermo Scientific™ Phenom™ Desktop SEM with Thermo Scientific™ ParticleMetric software allows easy generation and analysis of SEM images. The integrated ParticleMetric software allows the user to gather morphology and particle size data for many submicron particle applications.
The Thermo Scientific™ Elemental Mapping Software is an option within the EID software package (that comes default with the Thermo Scientific™ Phenom™ EDX solution). Elemental mapping reveals the distribution of elements within the sample.
From whole-core CT to SEM, Thermo Scientific PerGeos Software is a unique solution for Digital Rock Analysis trusted by Oil & Gas peers. Its visualization, processing, and analysis of 2D and 3D digital rock imagery enables improved evaluation of reservoir quality and faster understanding of static...
The Thermo Scientific™ Hyperion II System offers fast, accurate transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement.
Thermo Scientific™ Meridian™ M system system uses high sensitivity broadband DBX™ photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. Given results from wafer sort / chip probe, the Meridian M system delivers localization suitable for nanoprobing or...
The Thermo Scientific Meridian EX System is an innovative electron-beam-based solution for precise defect localization in advanced logic devices. Using groundbreaking e-beam technology, rather than optical (laser), it allows probing through complex wiring networks from the frontside or backside of...