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Meet technical cleanliness standards with confidence
In other areas of technical cleanliness, where even minute particles can cause significant issues, particle analysis is indispensable. Industries such as aerospace, medical devices, and semiconductor manufacturing rely on stringent cleanliness requirements to ensure product functionality and integrity. By employing advanced particle analysis techniques, manufacturers can maintain the desired level of cleanliness and mitigate the risks associated with particle-induced malfunctions or contamination.
Analysis supporting industrial quality standards
The Thermo Scientific Phenom ParticleX TC Desktop SEM empowers you to answer the critical question: Is my product clean enough? By significantly enhancing both the imaging quality and the scope of particle analysis compared to traditional optical microscopy, it provides you with confidence in your results.
Large mineral fiber detected with the Phenom ParticleX TC Desktop SEM
Automated, unbiased answers
The system’s automated analysis capabilities are designed to precisely identify hard particles and align them with established cleanliness specifications. It generates comprehensive, actionable, and easy-to-read reports that comply with industry standards such as VDA 19, ISO 16232, and ISO 4406/4407. This level of automation helps to ensure unbiased and consistent results, reducing the potential for human error and delivering reliable data every time.
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Cable cross section imaged for technical cleanliness analysis.
Efficient and easy to use
Engineered with a user-centric approach, this system features an intuitive interface that simplifies operation and minimizes the learning curve. It is not only easy to operate but also quick to master, resulting in faster throughput. This efficiency opens particle and material analysis to a broader range of users. Your team can swiftly adapt to the system, start generating reliable data, and enhance overall productivity.
-1024x576.png "SEM imaging for technical cleanliness analysis")
Extensive elemental analysis
In comparison to conventional light microscopy, this system integrates advanced technologies such as energy-dispersive spectroscopy (EDS) and an optional secondary electron detector (SED). These features introduce a new level of depth to your compositional and elemental analysis, particularly for microstructures, fibers, and particles. Whether you are focusing on topography or morphology, the system delivers detailed and precise insights that are crucial for high-precision applications.
Phenom ParticleX TC Desktop SEM technical specifications
For Research Use Only. Not for use in diagnostic procedures.