Jun 18, 2018 - Jun 22, 2018
Strasbourg, France
European Materials Research Society

Join us the 2018 E-MRS Spring Meeting on booths 24/25 to learn about the latest advances in X-ray Diffraction, X-Ray Fluorescence and X-ray Photoelectron Spectrometry.  Our experts will be available to discuss your materials analysis challenges.

Don’t miss our presentation:

Kinetics of corrosion of high alumina refractories by molten oxides with time-resolved high-temperature X-ray diffraction
Wednesday 20th June - 12h15
Session II - Ref. 5

Not going to EMRS? Use the form below to request a copy of the presentation to be emailed to you after the show.

Featured products

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

Occupying a third of the space of a conventional diffractometer, this stand alone, transportable bench top instrument offers true flexibility; no external water cooling is required and it plugs into a standard electrical power outlet.

The ARL Equinox 100 simplifies operation without sacrificing speed or performance. Measurements are completed in seconds and operating conditions are saved in the software.

Thermo Scientific ARL QUANT'X EDXRF Spectrometer

Get composition data on virtually any sample in minutes. The ARL QUANT'X EDXRF Spectrometer provides major, minor and trace element quantification across the broadest range of samples, including bulk solids, granules, powders, thin films and liquids. Featuring standardless software and accessories, this complete benchtop EDXRF (Energy Dispersive X-ray Fluorescence) system meets the elemental analysis needs of central and contract laboratories, as well as the environmental monitoring, chemicals, mining, forensics, food, cement and metals industries.

Thermo Scientific Nexsa X-Ray Photoelectron Spectrometer (XPS) System

The Nexsa X-Ray Photoelectron Spectrometer (XPS) System enables fully automated multi-technique analysis along with high throughput without sacrificing research grade results.  Integration of multiple analytical techniques like ISS, UPS, REELS and Raman allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development and many other applications.

Visit us on Booth 24/25 to see for yourself!

Request a copy of the presentation or/and schedule an appointment to meet with us at E-MRS.