The choice of the correct combination of analytical techniques to understand a sample is an increasingly important decision for a surface analyst. X-ray photoelectron spectroscopy (XPS) is the foundation of surface analysis, but sometimes additional methods are needed to complete the experiment.
The Thermo Scientific Nexsa Surface Analysis System and the Thermo Scientific ESCALAB Xi+ XPS Microprobe have the ability to add other analytical techniques, co-incident with the XPS analysis position, to help you achieve a more comprehensive analysis.
This webinar will introduce these additional techniques and show how they can be used with XPS to build comprehensive understanding of the surfaces of materials.
Attend this webinar to learn:
- The basics of ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), UV photoelectron spectroscopy (UPS), Auger electron spectroscopy (AES), and Raman spectroscopy
- The extra information that these techniques can provide to complement XPS
- How easy it is to run an analysis, and see examples that show the benefits of using different technique combinations to get more complete answers
Run time: 60 minutes
Learn more about Multi-technique XPS workflow.
Submit the form below to register for the on-demand webinar.