Semiconductor circuit edit and circuit prototyping
Accelerating product development and time-to-market are critical as missing a technology window, or falling behind, can be extremely costly. As design and integration complexity rise with each new technology node, circuit edit tools are strategically important for managing costs, avoiding schedule delays, and optimizing product performance and functionality.
With the right tools, workflows and techniques, circuit editing can help companies reduce mask spins, rapidly prototype, and support customer design in schedules.
Designed specifically for complex semiconductor circuit editing, the Thermo Scientific Centrios and Centrios HX Circuit Edit Systems provide industry leading precision, control, and performance for the semiconductor devices of today and tomorrow.
Centrios HX Circuit Edit System
The Centrios HX Circuit Edit System is designed for the most advanced front and backside edit capabilities with unparalleled editing control, precision, and stability.
Featuring the new Thermo Scientific Celta Focused Ion Beam (FIB) Column, the Centrios HX System delivers high resolution at low beam currents and low landing energies, allowing you to perform edits accurately and with minimum circuit damage. Using an innovative dual-nozzle gas-delivery system with the broadest portfolio of chemistries, and the latest FIB technology, the Centrios HX System enables industry leading high-precision etching and fast, efficient editing.
Centrios Circuit Edit System
The Centrios Circuit Edit System utilizes the field-proven Thermo Scientific Tomahawk WDR Ion Column, providing strong performance and cost of ownership. The Centrios System enables precise front and backside editing, rapid prototyping, and silicon debug and repair for today’s established process nodes.
Imaging and milling resolution
Centrios System – High resolution at low beam currents for effective, safe edits using the field-proven Thermo Scientific Tomahawk WDR FIB Column.
Centrios HX System – 25% higher resolution at 4X lower beam currents for effective, safe edits using the new Thermo Scientific Celta FIB Column with the latest beam profile improvements.
Enhanced milling precision and control
Planarity/uniformity, delayering/etch stopping, and high-acuity creation of high-aspect-ratio vias using a simultaneous dual-nozzle gas delivery system and proprietary gas chemistry portfolio.
Dedicated circuit edit platform
Designed specifically for circuit editing, the Centrios and Centrios HX Circuit Edit Systems integrate key components, such as gas chemistry delivery, enabling optimized manual and automated applications.
Low cost of operation
Thermo Scientific NEXS CAD Software for navigation and Thermo Scientific iFAST Software customize automation for improve efficiency and ease of use.
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Fundamentals of Circuit Edit eBook
While circuit editing is a well-established technique, it can be especially difficult for those who are new to it. To help you get started, we asked our circuit edit customers what they wish they had known when they started doing FIB circuit edit and collected their feedback, as well as input from our team of experts, in our new eBook: Fundamentals of Circuit Edit. The eBook includes:
- A definition of circuit edit
- An overview of focused ion beams
- Circuit edit tips from experienced practitioners
- Descriptions of key circuit edit tools and solutions
Fundamentals of Circuit Edit eBook
While circuit editing is a well-established technique, it can be especially difficult for those who are new to it. To help you get started, we asked our circuit edit customers what they wish they had known when they started doing FIB circuit edit and collected their feedback, as well as input from our team of experts, in our new eBook: Fundamentals of Circuit Edit. The eBook includes:
- A definition of circuit edit
- An overview of focused ion beams
- Circuit edit tips from experienced practitioners
- Descriptions of key circuit edit tools and solutions
Semiconductor Pathfinding and Research
Advanced electron microscopy, focused ion beam, and associated analytical techniques for identifying viable solutions and design methods for the fabrication of high-performance semiconductor devices.
Semiconductor Failure Analysis
Increasingly complex semiconductor device structures result in more places for failure-inducing defects to hide. Our next-generation workflows help you localize and characterize subtle electrical issues that affect yield, performance, and reliability.
Circuit Edit
Advanced, dedicated circuit edit and nanoprototyping solutions, which combine novel gas-delivery systems with a broad portfolio of chemistries and focused ion beam technology, offer unparalleled control and precision for semiconductor device development.
Circuit Edit
Advanced, dedicated circuit edit and nanoprototyping solutions, which combine novel gas-delivery systems with a broad portfolio of chemistries and focused ion beam technology, offer unparalleled control and precision for semiconductor device development.
Electron microscopy services for
semiconductors
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
