Desktop SEM for materials science
The interdisciplinary field of materials science focuses on the diverse properties of matter and their potential applications in science and engineering. For that, a thorough analysis of the material is crucial, giving engineers and materials scientists the information they need to create novel materials with desirable properties.
A scanning electron microscope can help you observe and analyze material surfaces and interfaces, either for quality assurance purposes during production or for the analysis of compounds after processing.
The Phenom Desktop SEM product line features versatile and reliable topographic and elemental analysis (via integrated energy-dispersive X-ray spectroscopy (EDS) detectors) combined with an intuitive, easy-to-use software interface that allows even novices to quickly obtain their first high-quality results. This flexibility is ideal for materials science applications, where researchers of varied scientific backgrounds can all obtain vital analytical information.