The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.
Take in-house control of your data:
- Monitor critical characteristics of metal powders
- Apply to your powder-bed and powder-fed additive manufacturing processes
- Identify particle size distributions, individual particle morphology, and foreign particles
The Phenom ParticleX AM Desktop SEM is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.
General SEM usage
The Phenom ParticleX AM Desktop SEM features a chamber with an accurate and fast motorized stage that allows analysis of samples of up to 100 mm x 100 mm. In spite of this larger sample size, a proprietary loading shuttle keeps the vent/load cycle to an industry-leading sample-loading time of 60 seconds or less. In practice this improves the throughput factors to be greater than other SEM systems.
Additive manufacturing
The Phenom ParticleX AM Desktop SEM measures various size and shape parameters, such as minimum and maximum diameter, perimeter, aspect ratio, roughness, and feret diameter. All of these can be displayed with 10%, 50%, 90% values (e.g. d10, d50, d90).
Elemental mapping and line scan
For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX AM Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot. This is especially useful for coatings, paints and other applications with multiple layers for analyzing edges, coatings, cross sections, etc.
Secondary electron detector
A secondary electron detector (SED) is optionally available on the Phenom ParticleX AM Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore ideally suited to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.
Electron optical |
|
Electron optical magnification range |
|
Light optical magnification |
|
Resolution |
|
Image resolution options |
|
Acceleration voltages |
|
Vacuum levels |
|
Detector |
|
Sample size |
|
Sample loading time |
|
Desktop SEM Blogs
Want to unlock the great power of scanning electron microscopy without having to compromise on usability? Enhance your knowledge on Scanning Electron Microscopy and find out how Desktop SEM can optimally support your research in our Phenom Desktop SEM blogs.
Industrial Manufacturing Product Selector
The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application:
Alexander Bouman on the new Phenom ParticleX.
To support quality control professionals, the Phenom ParticleX comes in two models: the Phenom ParticleX AM for Additive Manufacturing and the Phenom ParticleX TC for Technical Cleanliness.
Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale
Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:
- ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
- ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
- Particle morphology for additive manufacturing feedstocks.
- Workflow examples for particle classifications and reporting.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Alexander Bouman on the new Phenom ParticleX.
To support quality control professionals, the Phenom ParticleX comes in two models: the Phenom ParticleX AM for Additive Manufacturing and the Phenom ParticleX TC for Technical Cleanliness.
Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale
Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:
- ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
- ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
- Particle morphology for additive manufacturing feedstocks.
- Workflow examples for particle classifications and reporting.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Technical Cleanliness
More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.
EDS Elemental Analysis
EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.
3D EDS Tomography
Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.
Atomic-Scale Elemental Mapping with EDS
Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.
Particle analysis
Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.
EDS Elemental Analysis
EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.
3D EDS Tomography
Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.
Atomic-Scale Elemental Mapping with EDS
Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.
Particle analysis
Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.
Electron microscopy services for
the materials science
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
