The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.

Take in-house control of your data:

  • Monitor critical characteristics of metal powders
  • Apply to your powder-bed and powder-fed additive manufacturing processes
  • Identify particle size distributions, individual particle morphology, and foreign particles

The Phenom ParticleX AM Desktop SEM is equipped with a chamber that allows the analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. 

Thermo Scientific Phenom ParticleX AM demo

Key Features

General SEM usage

The Phenom ParticleX AM Desktop SEM features a chamber with an accurate and fast motorized stage that allows analysis of samples of up to 100 mm x 100 mm. In spite of this larger sample size, a proprietary loading shuttle keeps the vent/load cycle to an industry-leading sample-loading time of 60 seconds or less. In practice this improves the throughput factors to be greater than other SEM systems.

Additive manufacturing

The Phenom ParticleX AM Desktop SEM measures various size and shape parameters, such as minimum and maximum diameter, perimeter, aspect ratio, roughness, and feret diameter. All of these can be displayed with 10%, 50%, 90% values (e.g. d10, d50, d90).

Elemental mapping and line scan

For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX AM Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot. This is especially useful for coatings, paints and other applications with multiple layers for analyzing edges, coatings, cross sections, etc.

Secondary electron detector

A secondary electron detector (SED) is optionally available on the Phenom ParticleX AM Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore ideally suited to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.


Specifications

Style Sheet for Products Table Specifications

Electron optical

  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents

Electron optical magnification range

  • 160 - 200,000x

Light optical magnification

  • 3–16x

Resolution

  • <10 nm

Image resolution options

  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels

Acceleration voltages

  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode

Vacuum levels

  • Low - medium - high

Detector

  • Energy dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)

Sample size

  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)

Sample loading time

  • Light optical <5 s 
  • Electron optical <60 s
Style Sheet for Media Tabs
Automatically acquired SEM image cobalt powder grouping printing material additive manufacturing
Automatically acquired SEM image cobalt-based powder grouping printing material Additive Manufacturing.
Irregular Co powder defective particles automated acquisition SEM image cobalt printing material additive manufacturing
Irregular Co based powder particle automatically acquired and analyzed by Phenom ParticleX AM Desktop SEM.
Screenshot Elemental Mapping
Screenshot Elemental Mapping
SEM image of smartphone
SEM image of smartphone
SEM image of textile
SEM image of textile
SEM image of cable
SEM image of cable
SED image taken with Phenom ParticleX AM Desktop SEM
SED image taken with Phenom ParticleX AM Desktop SEM.

Alexander Bouman on the new Phenom ParticleX.
To support quality control professionals, the Phenom ParticleX comes in two models: the Phenom ParticleX AM for Additive Manufacturing and the Phenom ParticleX TC for Technical Cleanliness.

Automatically acquired SEM image cobalt powder grouping printing material additive manufacturing
Automatically acquired SEM image cobalt-based powder grouping printing material Additive Manufacturing.
Irregular Co powder defective particles automated acquisition SEM image cobalt printing material additive manufacturing
Irregular Co based powder particle automatically acquired and analyzed by Phenom ParticleX AM Desktop SEM.
Screenshot Elemental Mapping
Screenshot Elemental Mapping
SEM image of smartphone
SEM image of smartphone
SEM image of textile
SEM image of textile
SEM image of cable
SEM image of cable
SED image taken with Phenom ParticleX AM Desktop SEM
SED image taken with Phenom ParticleX AM Desktop SEM.

Alexander Bouman on the new Phenom ParticleX.
To support quality control professionals, the Phenom ParticleX comes in two models: the Phenom ParticleX AM for Additive Manufacturing and the Phenom ParticleX TC for Technical Cleanliness.

Applications

Process Control_Thumb_274x180_144DPI

Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&amp;D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

Aluminum mineral grain found with SEM during parts cleanliness testing

Cleanliness
 

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Documents

Datasheets

Contact us

Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

Learn more ›

Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards