Phenom ParticleX AM Desktop SEM

Add greater speed and efficiency to your additive manufacturing analysis

If you want to step up the quality and precision of your additive powder testing—with more detailed analysis and accurate size measurements—the Thermo Scientific Phenom ParticleX AM Desktop SEM can help. For both powder-bed and powder-fed additive manufacturing (AM) processes, it can help you analyze the critical characteristics of metal powders at the microscale. Plus, it allows you to work with up to 49 samples simultaneously.

 

But what really sets this system apart is the integrated Thermo Scientific Perception Software, which automatically finds and identifies debris, spherical or elongated particles, and other particles, thus proving the quality of the powder. It then delivers concise industrial reports that turn raw data into clear and unbiased answers for you and your team.

 

The Phenom ParticleX AM Desktop SEM comes with integrated energy-dispersive X-ray spectroscopy (EDS) for advanced compositional analysis. And you can add a secondary electron detector (SED), which collects low-energy electrons from the top surface layer of the sample to provide detailed surface information.

Phenom ParticleX AM Desktop SEM overview

Meet industrial quality standards with confidence

With the Phenom ParticleX AM Desktop SEM, you can analyze the composition and size of particles as well as shape parameters (diameter, perimeter, aspect ratio, roughness, and Feret diameter)—all at the microscale and with far greater precision than other technologies.

Industry-leading throughput

The Phenom ParticleX AM Desktop SEM delivers fast throughput, so you can do more with the microscope and increase production cycle time.  

Automated efficiency from sample to report

The integrated automation features delivered by Perception Software make this system incredibly easy to use and deliver actionable, ready-to-read reports that summarize findings without bias—all with minimal effort required.

Confident chemical analysis

Not only does this system include integrated EDS for complex chemical and elemental analysis, but it also shows the overall chemistry of the particle population via a ternary diagram that displays all particles.

Phenom ParticleX AM Desktop SEM resources

Would you like to know more about this system? Dive into a wealth of resources, from eBooks to datasheets.

Particle analysis learning center

Learn more about the role of electron microscopy in particle analysis with our collection of articles, eBooks, and webinars.

For Research Use Only. Not for use in diagnostic procedures.