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Battery materials

Phenom Desktop SEM designed for battery materials analysis

In battery production and research, the quality of materials is becoming critical. Small contaminants in the NCM powder, for example, can have disastrous results in the final product. To trace these contaminants effectively, high-resolution SEM imaging with EDS analysis for chemistry is needed. When fully automated, this combination is a powerful tool for powder quality inspection.


Key Features


Conductance classifications

Each particle class can be labeled with a conductance of the particles, allowing you to sort on conductance of particles. This allows you to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination.

Ternary diagram

To view overall chemistry of the particle population, a ternary diagram can be generated where all particles are represented. With Ni, Co, and Mn on each axis, the outyears and general trends can be seen instantly.

 

Specifications

 

Style Sheet for Products Table Specifications
Electron optical
  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents
Electron optical magnification range
  • 160 - 200,000x
Light optical magnification
  • 3–16x
Resolution
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low - medium - high
Detector
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)
Sample loading time
  • Light optical <5 s 
  • Electron optical <60 s


Resources


Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series

In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.

  • How to certify your NCM powder quality with SEM+EDS
  • Electron-microscope-grade cleanliness in electronics
  • Speed up your automated gunshot residue analysis
  • Technical cleanliness analysis with an SEM: Why?
  • Understand your steel with automated inclusion analysis
  • One tool for complete AM powder characterization

On-demand webinar: New Phenom ParticleX Steel Desktop SEM

Watch our on-demand webinar to learn more about:

  • Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
  • Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
  • Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
  • High-quality, in-house SEM quality control

On-demand webinar: New Phenom ParticleX Steel Desktop SEM

Watch our on-demand webinar to learn more about:

  • Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
  • Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
  • Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
  • High-quality, in-house SEM quality control

Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale

Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:

  • ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
  • ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
  • Particle morphology for additive manufacturing feedstocks.
  • Workflow examples for particle classifications and reporting.

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.
Alexander Bouman on the new Phenom ParticleX

ParticleX Steel Desktop SEM - Workflow introduction

Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series

In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.

  • How to certify your NCM powder quality with SEM+EDS
  • Electron-microscope-grade cleanliness in electronics
  • Speed up your automated gunshot residue analysis
  • Technical cleanliness analysis with an SEM: Why?
  • Understand your steel with automated inclusion analysis
  • One tool for complete AM powder characterization

On-demand webinar: New Phenom ParticleX Steel Desktop SEM

Watch our on-demand webinar to learn more about:

  • Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
  • Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
  • Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
  • High-quality, in-house SEM quality control

On-demand webinar: New Phenom ParticleX Steel Desktop SEM

Watch our on-demand webinar to learn more about:

  • Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
  • Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
  • Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
  • High-quality, in-house SEM quality control

Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale

Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:

  • ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
  • ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
  • Particle morphology for additive manufacturing feedstocks.
  • Workflow examples for particle classifications and reporting.

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.
Alexander Bouman on the new Phenom ParticleX

ParticleX Steel Desktop SEM - Workflow introduction


Applications


Process control using electron microscopy

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality control and failure analysis using electron microscopy

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Fundamental Materials Research_R&amp;D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

Aluminum mineral grain found with SEM during parts cleanliness testing

Technical Cleanliness

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.


 

Techniques

 

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

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