The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling technical cleanliness at the microscale.

A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is simple to operate and fast to learn, opening up particle and material analysis to a wider group of users.

Thermo Scientific Phenom ParticleX TC demo

Key Features

Technical cleanliness

With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy with energy-dispersive X-ray spectroscopy (EDS). This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407 are available.

Secondary electron detector

A secondary electron detector (SED) is optionally available on the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The SED collects low-energy electrons from the top surface layer of the sample. It is therefore the perfect choice to reveal detailed sample surface information. The SED can be of great use for applications where topography and morphology are important. This is often the case when studying microstructures, fibers or particles.

General SEM usage

The user interface is based on the proven ease-of-use technology applied in the successful Phenom desktop SEM products. The interface enables both existing and new users to quickly become familiar with the system with a minimum of training. 

Elemental mapping and line scan

For a user, it is simply click and go to work with the elemental mapping and line scan functionality of the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM. The line scan functionality shows the quantified element distribution in a line plot. 

Specifications

Style Sheet for Products Table Specifications
Electron optical
  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents
Electron optical magnification range
  • 160 - 200,000x
Light optical magnification
  • 3–16x
Resolution
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low - medium - high
Detector
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)
Sample loading time
  • Light optical <5 s 
  • Electron optical <60 s
Style Sheet for Media Tabs
Alexander Bouman on the new Phenom ParticleX

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.
Alexander Bouman on the new Phenom ParticleX

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

Applications

Process Control_Thumb_274x180_144DPI

Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&amp;D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

Aluminum mineral grain found with SEM during parts cleanliness testing

Cleanliness
 

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Documents

Datasheets


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To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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