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Technical Cleanliness Analysis Using Desktop SEM
Manufacturers must innovate and improve components quickly and reliably without compromising quality. Higher cleanliness standards demand thorough analysis to meet expectations. Surface cleanliness is crucial for the adhesion of coatings and treatments, impacting the final quality.
Thermo Fisher Scientific's desktop scanning electron microscopy (SEM) provides high-quality surface analysis and elemental characterization with energy-dispersive X-ray spectroscopy (EDS), helping manufacturers comply with stringent quality guidelines
Technical cleanliness in automotive manufacturing
In automotive manufacturing, ensuring technical cleanliness is critical to prevent component failure due to contaminants. Particles like Al2O3, SiC, and SiO2 can cause scratches, jams, or short-circuits. Traditional methods using optical microscopes and gravimetric analysis are insufficient for detecting smaller, high-hardness particles.
The Thermo Scientific Phenom ParticleX TC Desktop SEM with EDS was introduced to address this challenge. It provides detailed analysis of particle size and chemical composition, identifying contaminants that optical techniques miss. This capability allows teams to monitor and control hard particles effectively, improving product performance and reducing risks.
With the Phenom ParticleX Desktop SEM, you can rapidly analyze and address contamination issues, leading to higher product quality and faster time-to-market. This desktop SEM's efficiency and precision are key to achieving these improvements.
Automotive manufacturing assembly line where technical cleanliness of parts is essential
Reduce contamination in compressor manufacturing
In a busy manufacturing plant, the compressors that are essential to production were often contaminated, leading to costly delays. The team at SANDEN Manufacturing Europe urgently needed a swift solution and discovered it in the Phenom ParticleX TC Desktop SEM.
This advanced tool revealed contaminants in large detail, allowing the team to identify and address issues swiftly. Its ease of use meant operators could load multiple filters at once and let the microscope handle the analysis, saving valuable time.
With the Phenom ParticleX TC Desktop SEM, unexpected findings led to continuous improvements. The microscope became essential, helping the team maintain smooth operations and push the boundaries of innovation.
For Research Use Only. Not for use in diagnostic procedures.