The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.

The Phenom Pure Desktop SEM provides high-quality images while using basic features, and offers the market’s fastest loading and imaging time. The very reliable autofocus and automated source alignments make this the most user-friendly system on the market. 

Key Features

Never lost navigation

The user always knows the position on the sample with the unique never lost navigation. Overviews of both the optical and electron optical images provide clear reference points at all times. 

Easy to use

Users are ready to take images after only 10 minutes of basic training. A large variety of sample holders is available to accommodate a large range of samples. Sample loading is fast and safe due to our patented sample vacuum loading technology.

Customize your SEM

The Phenom Pure Desktop SEM can be equipped with two optional detector systems.  The first one is a fully integrated energy dispersive spectroscopy (EDS) system. The second is a secondary electron detector (SED) for applications that require surface and topography sensitive imaging. 


Specifications

Style Sheet for Products Table Specifications
Light optical magnification
  • Fixed 20x
Electron optical magnification range
  • 80–65,000x
Resolution
  • ≤25 nm
Digital zoom
  • Max. 12x
Light optical navigation camera
  • Black & White
Acceleration voltages
  • Default: 5 kV and 10 kV
Vacuum modes
  • High-vacuum mode
  • Charge-reduction mode (low vacuum mode)
Detector
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy detector (optional)
  • Secondary electron detector (optional)
Sample size
  • 25 mm diameter (up to 32 mm optional)
Sample height
  • 35 mm (up to 100 mm optional)
Style Sheet for Media Tabs
SEM image of gear wheel
SEM image of gear wheel
SEM image of feather bird
SEM image of feather bird
SEM image of diatom
SEM image of diatom
SEM image of smartphone
SEM image of smartphone
SEM image of pink clover stamens
SEM image of pink clover stamens
SEM image of cable
SEM image of cable
SEM image of textile
SEM image of textile
SEM image of metal particle
SEM image of metal particle
SEM image of double Perovskite LaSrZnFeO<sub>6</sub>
SEM image of double Perovskite LaSrZnFeO6

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.
SEM image of gear wheel
SEM image of gear wheel
SEM image of feather bird
SEM image of feather bird
SEM image of diatom
SEM image of diatom
SEM image of smartphone
SEM image of smartphone
SEM image of pink clover stamens
SEM image of pink clover stamens
SEM image of cable
SEM image of cable
SEM image of textile
SEM image of textile
SEM image of metal particle
SEM image of metal particle
SEM image of double Perovskite LaSrZnFeO<sub>6</sub>
SEM image of double Perovskite LaSrZnFeO6

Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

Applications

Process Control_Thumb_274x180_144DPI

Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality Control_Thumb_274x180_144DPI

Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&amp;D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Imaging Hot Samples

Studying materials in real-world conditions often involves working at high temperatures. The behavior of materials as they recrystallize, melt, deform, or react in the presence of heat can be studied in situ with scanning electron microscopy or DualBeam tools.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Documents

Datasheets

Contact us

Electron microscopy services

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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