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The Thermo Scientific Meridian S System is designed to perform inverted photon emission (EMMI) and laser scanning microscopy analysis on devices stimulated by static bias via probe card or micro-probes. With the overall cost of ownership for the system being a critical aspect of profitability, the Meridian S System offers a range of photon emission options, dual-side probing flexibility and an upgrade path to dynamic optical fault isolation capabilities such as laser voltage imaging/probing and soft defect localization.
The Meridian S System is designed for use in failure analysis labs worldwide, aiding in:
- Identification of systematic process, design or integration issues
- Isolation of root cause for random electrical failures
Fault Diagnostic with Active Probe Technology
High-sensitivity, lock-in capable, noise-eliminating static laser stimulation/optical beam induced resistance change (SLS/OBIRCH) detection enabled by Fault Diagnostic with Active Probe Technology.
Photon emission
Photon emission options spanning a range of sensitivity requirements for isolating shorts, detecting areas of excess leakage, and mapping active regions.
Ease-of use
Probing setup and software designed for ease-of-use and productivity.
Scalable and upgradable
Fully scalable and upgradable optical platform.
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Inverted optical system |
Combo system: LSM + PEM standard, with optional LSM-only or PEM-only configurations |
220VAC, 50Hz/60Hz |
Standard 9” x 9” load board interface, plus customizable alternatives |
Dual-side microprobing and Probe Card configurations available |
Stage repeatability ≤2μm |
Optional laser marker for defect redetection |
Semiconductor research and development
Innovation starts with research and development. Learn more about solutions to help you understand innovative structures and materials at the atomic level.
Semiconductor Failure Analysis
Complex semiconductor device structures result in more places for defects to hide. Learn more about failure analysis solutions to isolate, analyze, and repair defects.
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Optical Fault Isolation
Increasingly complex designs complicate fault and defect isolation in semiconductor manufacturing. Optical fault isolation techniques allow you to analyze the performance of electrically active devices to locate critical defects that cause device failure.
Optical Fault Isolation
Increasingly complex designs complicate fault and defect isolation in semiconductor manufacturing. Optical fault isolation techniques allow you to analyze the performance of electrically active devices to locate critical defects that cause device failure.
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Electron microscopy services for
semiconductors
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
Electron microscopy support and resources
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