Thermo Scientific Auto Slice and View 4 (AS&V4) Software allows for automated acquisition of high-resolution 3D images and analytical maps such as EBSD (electron backscatter diffraction) or EDS (energy-dispersive X-ray spectroscopy). AS&V4 Software acquires data by milling serial sections (slices) of a sample with a focused ion beam (FIB) and then imaging and/or mapping each slice.

Due to the destructive nature of FIB cross sectioning, it is important to collect as much information as possible from each section. AS&V4 Software allows you to acquire multiple imaging and analysis modalities for every slice, including information such as material and channeling contrast generated by multiple SEM and FIB detectors. Additionally, elemental information can be collected with EDS, and grain orientation/strain-texture analysis can be provided by EBSD mapping.

AS&V4 Software user interface
AS&V4 Software user interface

Key Features

Software for Electron Microscopes

Auto Slice and View Software

Serial section 3D imaging software with EDS and EBSD capability.


Intuitive, easy to use UI

Streamlined workflows, milling recipes, integrated auto functions.

Digital tilt-shift compensation

Improve collection efficiency and accuracy.

On-the-fly editing capabilities

Adjust parameters as needed if encountering phase/microstructural change.

Integrated imaging

Integrates SEM and FIB imaging, EBSD and EDS mapping into one package.

Information on every slice

Acquire all the information on every slice (imaging, analytics, current, voltage, tilt, etc.).

Highly flexible and reliable acquisition

Highly flexible and reliable acquisition with precise and repeatable cut placement.

High speed and throughput

High speed and throughput with multi-site capability.

Applications

Life_Sciences_Application_274x180_144DPI

Structural Biology Research
 

Cryo-electron microscopy enables the structural analysis of challenging biological targets such as large complexes, flexible species and membrane protein.

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

Style Sheet for Techniques (LONG VERSION) and Media Gallery Tab

Cryo-Tomography

Cryo-electron tomography (cryo-ET) delivers both structural information about individual proteins as well as their spatial arrangements within the cell. This makes it a truly unique technique and also explains why the method has such an enormous potential for cell biology. Cryo-ET can bridge the gap between light microscopy and near-atomic-resolution techniques like single-particle analysis.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Cryo-Tomography

Cryo-electron tomography (cryo-ET) delivers both structural information about individual proteins as well as their spatial arrangements within the cell. This makes it a truly unique technique and also explains why the method has such an enormous potential for cell biology. Cryo-ET can bridge the gap between light microscopy and near-atomic-resolution techniques like single-particle analysis.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Documents

Datasheets


Contact us

Electron microscopy services

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

Learn more ›

Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards