Integrated Thermo Scientific Phenom ParticleMetric Software allows you to gather morphology and particle size data for numerous sub-micron particle applications with any Phenom Desktop SEM. The fully automated measurements of ParticleMetric Software allow a level of visual exploration beyond optical microscopy that can lead to new discoveries and innovations in powder design, development, and quality control. 

Phenom ParticleMetric Software provides insightful data about your particles quickly and easily; these insights can help you improve the quality of your products and expedite your research.

Key Features

Online and offline analysis

Integrated within Thermo Scientific Phenom ProSuite Software for online and offline analysis.

Correlating features

Correlate particle features such as diameter, circularity, aspect ratio and convexity.

Advanced detection algorithm

Features an advanced detection algorithm with default settings for non-expert user and advanced settings for experts.

Automated image mapping

Create image datasets with complimentary automated image mapping software.


Specifications

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Particle size range

  • 100 nm - 0.1 mm

Particle detection

  • 8/16 bit image processing

Speed

  • More than 1,000 particles per minute

Measured properties

  • Size, shape, count

Particle parameters      

  • Area, circle equivalent diameter, surface area, circumscribed circle diameter, volume by area, circumference, aspect ratio, circularity, elongation, grayscale, major axis, minor axis, convex hull, gravity center (x,y), pixel count, and convexity.

Digital image detection                  

  • Plot graphs in linear, log or double log scale, by number or by volume
  • Scatter plots of any given parameter
  • SEM image of individual particle

Output

  • Report in docx format, TIFF image format, CSV file, Project file (.PAME) for offline analysis

Part of ProSuite Software

  • Network storage enabled
  • Phenom integrated system
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Applications

Aluminum mineral grain found with SEM during parts cleanliness testing

Cleanliness
 

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Energy Dispersive Spectroscopy

Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›


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