Spectra Transmission Electron Microscope Features

The Spectra (S)TEM is equipped with the new S-TWIN' pole piece that offers ultra-high spatial resolution in scanning transmission electron microscopy (e.g., 50 pm at 300 kV and 96 pm at 60 kV) and a wide gap for experiments with large tilt angles or bulky in situ holders. The S-TWIN' supports a high solid-angle EDX solution without compromising spatial resolution. Combined with enhanced mechanical stability and the latest S-CORR probe corrector, it matches the combined spatial resolution and high probe current specifications of the Spectra 300 TEM, ensuring exceptional imaging and beam intensity for various applications.

The Spectra (S)TEM can be configured with a new cold field emission gun (X-CFEG) with high brightness and low energy spread. It operates from 30-300 kV, providing high-resolution scanning transmission electron microscopy imaging with high probe currents. The X-CFEG allows flexible tuning of probe currents and energy resolution, enabling a wide range of experiments. Tip flashing is required once per working day, with no impact on probe aberrations or tip lifetime. The X-CFEG also supports standard TEM imaging experiments with large parallel probes.

When equipped with either the X-FEG/Mono or X-FEG/UltiMono, the Spectra (S)TEM achieves the higher STEM resolution specifications. With enhanced mechanical stability, fifth-order probe aberration correction, and a high-resolution (S-TWIN) wide-gap pole piece, it delivers resolutions of 50 pm at 300 kV, 96 pm at 60 kV, and 125 pm at 30 kV with 30 pA or 100 pA probe current (with X-CFEG).

STEM imaging on the Spectra (S)TEM is transformed with the Panther STEM Detection System. Featuring two new solid-state detectors with 16 segments, this system offers advanced imaging capabilities and single-electron sensitivity. Optimized signal chain and low-dose imaging enable beam-sensitive material imaging, while the scalable architecture allows you to combine detector segments and synchronize multiple signals for innovative STEM techniques.

The Spectra (S)TEM can be configured with either an electron microscope pixel array detector or a Thermo Scientific Ceta Camera with speed enhancement for 4D-STEM data collection. The detector provides high dynamic range, signal-to-noise ratio, and speed, making it optimal for 4D-STEM applications. The Ceta Camera offers higher resolution diffraction patterns and is suitable for applications such as strain measurement and EDS analysis.

The Spectra (S)TEM offers spectroscopic flexibility to meet various analytical requirements, from elemental mapping in EDS and EELS to surface probing with ultra-high-resolution EELS. With multiple source options, EDS detector geometries, and Gatan Continuum Spectrometers, you can configure the system to suit your research needs. The Thermo Scientific EDS detector portfolio provides choices for optimized EDS results, compensating for holder shadowing and offering clean and quantifiable data. The Super-X Detector offers spectral cleanliness and quantification, while the Dual-X Detector provides high-throughput mapping capabilities. The system enables sub-Angstrom spatial information and fast, quantifiable STEM-EDS analysis.

The Spectra (S)TEM offers the ability to study pristine magnetic structures in a field-free mode. Configurable with virtually zero magnetic field across the sample volume, experiments can be conducted in both TEM and STEM modes. This enables high-resolution studies such as DPC or ptychography with resolution down to <0.5 nm. In situ magnetization can also be performed to observe the behavior of structures under real operating conditions.