ESCALAB QXi X-ray Photoelectron Spectrometer Microprobe
Meet your demands for increased analytical performance and flexibility with the Thermo Scientific™ ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS) Microprobe, which combines high spectral sensitivity and resolution with quantitative imaging and multi-technique capabilities.
The ESCALAB QXi XPS Microprobe is an expandable and optimized multi-technique instrument with unparalleled flexibility and configurability. It is extremely sensitive, producing high-quality spectra in seconds. System control, data acquisition, processing, and reporting are seamlessly integrated in the powerful Thermo Scientific Avantage Data System. The cutting-edge technology, driven by intuitive software, guarantees world-class results and productivity. The ESCALAB QXi XPS Microprobe, with its unique dual detector system, also delivers superb XPS imaging with excellent spatial resolution.
Thermo Scientific ESCALAB QXi Microprobe Auto Sample Transfer
Monochromated XPS
The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option), and allows you to select any sample spot size ranging from 200 µm to 900 µm.
Flood electron source
An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.
Lens and analyzer
The lens and analyzer system on the ESCALAB QXi XPS Microprobe is optimized for both spectroscopy and for parallel imaging; the single analyzer path means that the same instrument parameters (e.g., pass energy) can be used for both spectroscopy and imaging.
Detectors
The ESCALAB QXi XPS Microprobe is fitted with two detector systems: one optimized for spectroscopy, consisting of an array of six-channel electron multipliers, and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.
Ion gun
The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy; and the optional monatomic and gas cluster ion source, MAGCIS, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.
Digital Control
All analytical functions are controlled from the Windows Software-based Avantage data system, meaning that the entire analysis process can be performed remotely, if required.
Alignment and calibration
A standards block, which has samples of copper, silver, and gold, can be used for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.
Sample alignment
All axes of movement on the sample stage are controlled by the Avantage Data System, and a high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position.
Sample manipulator
The computer-controlled, 5-axis, high-precision translator (HPT) allows accurate sample alignment for analysis. When coupled with the new automated sample loading system, it can be used to automatiucally exchange sample holders and run queued experiments.
Vacuum system
The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 x 10-10 mbar.
Preparation chambers
The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating/cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.
Connectivity
Measurement coordinates can be imported into Avantage Data System from dedicated microscopy systems using Thermo Scientifc Maps Software for even faster identification of measurement areas. XPS spectroscopy and imaging data can be added into Maps Software to allow direct comparison of surface chemistry and structural information.
| Monochromated X-ray source |
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| Analyze |
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| Ion source |
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| Vacuum system |
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| Sample stage |
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| Included standard analysis techniques |
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| Optional analysis techniques |
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| Optional accessories |
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| Sample preparation options |
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Find your ideal XPS instrument
Choosing the right XPS solution for your research is no easy feat. Take three minutes to fill out our XPS Product Selector and discover which X-ray photoelectron spectrometer is the most suitable for your surface analysis requirements.
X-ray photoelectron spectroscopy of atomic elements
A key feature of the Thermo Scientific Avantage Data System for XPS is an extensive knowledge base of information regarding XPS analysis and the elements they characterize.
Surface Analysis Learning Center
The chemistry of the surface of a material, or at the interfaces of layers, determines how a material behaves. Our surface analysis references and resources can help you engineer desired properties or better understand materials when they do not perform as expected.
Watch on-demand: new ESCALAB QXi XPS Applications Demonstration Webinar
Watch this webinar to:
- Learn how you can perform fully automated multi-technique surface analysis from a wide range of sample types, including metals, polymers, oxides, and battery materials.
- Watch the ESCALAB QXi Microprobe in action.
Watch on-demand: new ESCALAB QXi XPS Applications Demonstration Webinar
Watch this webinar to:
- Learn how you can perform fully automated multi-technique surface analysis from a wide range of sample types, including metals, polymers, oxides, and battery materials.
- Watch the ESCALAB QXi Microprobe in action.
Battery Research
Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.
Metals Research
Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.
Polymers Research
Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.
Geological Research
Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.
Oil and Gas
As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.
Nanoparticles
Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.
Forensics
Micro-traces of crime scene evidence can be analyzed and compared using electron microscopy as part of a forensic investigation. Compatible samples include glass and paint fragments, tool marks, drugs, explosives, and GSR (gunshot residue).
Catalysis Research
Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.
Fibers and Filters
The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features.
2D Materials
Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging.
Automotive Materials Testing
Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.
Multi-technique surface analysis workflow
To meet the need for extensive characterization of surfaces, we have established multi-technique workflows based on using either the Thermo Scientific ESCALAB CXi XPS Microprobe or the Thermo Scientific Nexsa Surface Analysis System. These instruments are designed as multi-technique workstations to provide comprehensive analyses in a timely and efficient manner.
X-Ray Photoelectron Spectroscopy
X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.
Multi-technique surface analysis workflow
To meet the need for extensive characterization of surfaces, we have established multi-technique workflows based on using either the Thermo Scientific ESCALAB CXi XPS Microprobe or the Thermo Scientific Nexsa Surface Analysis System. These instruments are designed as multi-technique workstations to provide comprehensive analyses in a timely and efficient manner.
X-Ray Photoelectron Spectroscopy
X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.
