K-Alpha X-ray Photoelectron Spectrometer
The Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) System brings a new approach to surface analysis. Focused on delivering high-quality results using a streamlined workflow, the K-Alpha XPS System makes XPS operation simple and intuitive, with no sacrifice in terms of performance or capabilities.
State-of-the-art performance, reduced cost of ownership, increased ease of use, and high sample throughput make the K-Alpha XPS System ideal for a multi-user environment. The K-Alpha XPS System gives more researchers around the world access to surface analysis.
Webinar: Thermo Scientific K-Alpha XPS System
High-performance X-ray source
The X-ray monochromator allows selection of analysis area from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.
Optimized electron optics
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.
The patented dual-beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.
Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Intuitive operation—guided by the Avantage data system—makes the K-Alpha XPS System ideal for both multi-user, shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.
Optional sample holders
Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.
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The chemistry of the surface of a material, or at the interfaces of layers, determines how a material behaves. Our surface analysis references and resources can help you engineer desired properties or better understand materials when they do not perform as expected.
A key feature of the Thermo Scientific Avantage Data System for XPS is an extensive knowledge base of information regarding XPS analysis and the elements they characterize.