Combining correlative imaging and surface analysis

A full understanding of your sample often requires analysis on different instruments. Imaging a sample in a scanning electron microscope (SEM) and acquiring the composition with energy dispersive X-ray spectroscopy (EDS) might not reveal the surface chemistry that is crucial to understanding a material’s performance. Conversely, knowledge of the surface chemistry of a sample may need more high-resolution imagery to fully capture how the interplay between chemistry and structure is affecting the behavior of a material.

By using the Thermo Scientific Correlative Imaging and Surface Analysis (CISA) Workflow, you can combine datasets from our X-ray photoelectron spectroscopy (XPS) and SEM instruments to more fully understand your samples.

Download the eBook to learn more about:

  • The technology and uses of XPS, SEM, and EDS
  • The benefits of combining XPS with SEM
  • How Thermo Scientific Maps Software supports the CISA Workflow
  • Three use cases for the CISA Workflow

Download the Correlative Imaging and Surface Analysis Workflow eBook >