Over the years, scanning electron microscopy has become a powerful tool in many different research fields. The main reason for this growth in popularity is the continuously shrinking dimensions of the materials used in various applications.
SEMs are a key tool for basic research, quality control, and failure analysis. Many high-tech developments across multiple industries would be impossible without the information this unique piece of laboratory equipment provides.
A scanning electron microscope scans a sample with an electron beam to produce a magnified image for analysis. SEMs provide a superior depth of field and resolution, compared to optical microscopes. They provide a comprehensive range of sample information, including topography, morphology, and chemical composition. That’s not all. Today’s SEMs are fast and accurate machines, reducing time to results, while maximizing performance and productivity.
Thermo Scientific Phenom desktop SEMs have been created to make the detailed imaging capabilities of scanning electron microscopy available to everyone by featuring enhanced ease of use.
Do you want to unlock the power of scanning electron microscopy without compromising on usability? Read our Phenom desktop SEM blogs to enhance your knowledge of SEM and find out how our instruments can optimally support your research.
We briefly describe the similarities and differences between the two main types of electron microscopes: TEMs (transmission electron microscopes) and SEMs (scanning electron microscopes).
We answer the questions: “How does an electron lens work? Which kinds of lenses exist? How are lenses combined to form an electron column?” We also provide a general insight into the working principles of an electron column.
We demonstrate the best practices for failure analysis using scanning electron microscopes (SEMs), which are powerful tools for many failure analysis applications because they reveal micro- and nanometer-scale structural details.
We answer the question: "Why was micro analysis so slow?" And we discuss the improvements in scanning electron microscope speed that are enabling rapid, automated SEM EDS analysis.
We reveal the benefits of automated quality control, examining the pros from both an automated quality control system and an automated quality control inspection perspective.
We examine two key methods, optical microscopy and scanning electron microscopy, revealing the benefits each technique brings and explaining their operation and differing application areas.
We examine how scanning electron microscopes (SEMs) and energy dispersive X-ray spectroscopy (EDS) can determine the nature of contaminant particles, easily enabling compliance with ISO 16232 and VDA 19 industry standards.
We examine a selection of SEM failure analysis and quality control systems, investigating the best SEMs for these applications. We explain how you can meet today’s demands for fast and accurate quality control and SEM failure analysis without compromising on the quality of your measurements and the depth of the resulting information.
We reveal how you can improve your in-house quality control with SEM. We explain how a scanning electron microscope gives you the ability to carry out speedy analysis, verification, and chemical classification of materials, while providing fast, accurate, and trusted data.
For lab managers, choosing the right SEM for your facility can seem confusing. There are a lot of different factors to take into account. We examine one of your most fundamental decision points: Should I opt for a floor-model SEM or a desktop SEM?
When comparing scanning electron microscope manufacturers, it’s important to assess each on the quality of their machines, areas of expertise, and the level of support they can provide. We examine which is the best for your lab.
The scanning electron microscope (SEM) is a critical tool in a broad range of research fields. SEM resolution can be anywhere between less than one nanometer and up to tens of nanometers. So, what is the best option for your material science lab?