Over the years, scanning electron microscopy has become a powerful tool in many different research fields. The main reason for this growth in popularity is the continuous shrinking of the dimension of materials used in various applications.
The Phenom Desktop Scanning Electron Microscopes (SEM) have been created to make the detailed imaging capabilities of electron microscopy available to everyone. Desktop SEM instruments boast enhanced ease of use, democratizing SEM technology.
Want to unlock the great power of scanning electron microscopy without having to compromise on usability? Enhance your knowledge on Scanning Electron Microscopy and find out how Desktop SEM can optimally support your research in our Phenom Desktop SEM blogs.
Learn more about Desktop Scanning Electron Microscopes
In this blog we briefly describe the similarities and differences between the two main types of electron microscopes: Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM).
In this blog, we will answer the questions "How does an electron lens work? And which kind of lenses exist? How are lenses combined to form an electron column?" and give a general insight into the working principle of an electron column.
The aim of this blog is to clarify the use of precise monitoring and characterization of particles, and how scanning electron microscopy can prove to be a valuable characterization method.
The aim of this blog is to demonstrate the best practices for SEM Failure Analysis since Scanning electron microscopes (SEMs) are powerful tools for many failure analysis applications because they reveal micro- and nanometer-scale structural details.
In this blog, we'll answer questions such as "Why was micro analysis so slow?" and show you the improvements in scanning electron microscope speed that are enabling rapid and automated SEM EDS analysis.
In this blog post, we'll reveal the benefits of automated quality control, examining the pros from both an automated quality control system and an automated quality control inspection perspective.
In this post, we examine two key methods: optical microscopy and electron microscopy, revealing the benefits each technique brings, and explaining both their differing application areas and operation.
In this blog post, we examine how Scanning Electron Microscopes (SEMs) and energy dispersive spectroscopy (EDS) can determine the nature of contaminant particles, allowing users to comply with the ISO 16232 and VDA 19 industry standards with ease.
In this blog post, we examine a selection of SEM failure analysis and quality control systems, investigating the best SEMs for these applications. We explain how you can meet today’s demands for fast and accurate quality control and SEM failure analysis, without compromising on the quality of your measurements and the depth of the resulting information.
In this post, we reveal how you can improve your in-house quality control with SEM. We explain how a scanning electron microscope gives you the ability to carry out speedy analysis, verification, and chemical classification of materials, while providing fast, accurate, and trusted data. Let’s look into the benefits that a SEM can bring to your in-house quality control now.
For lab managers, choosing the right SEM for your facility can seem confusing. There are a lot of different factors to take into account and, in this blog post, we examine one of the most fundamental decision points: should you opt for a Floor Model SEM or a Desktop SEM?
When comparing scanning electron microscope manufacturers, it’s important to assess each one on the quality of their machines, areas of expertise and the level of support they can provide. In this blog post we'll see which one is the best for your lab.