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Over the years, scanning electron microscopy has become a powerful tool in many different research fields. The main reason for this growth in popularity is the continuous shrinking of the dimension of materials used in various applications.

The Phenom Desktop Scanning Electron Microscopes (SEM) have been created to make the detailed imaging capabilities of electron microscopy available to everyone. Desktop SEM instruments boast enhanced ease of use, democratizing SEM technology.

Want to unlock the great power of scanning electron microscopy without having to compromise on usability? Enhance your knowledge on Scanning Electron Microscopy and find out how Desktop SEM can optimally support your research in our Phenom Desktop SEM blogs.

Learn more about Desktop Scanning Electron Microscopes

SEM and TEM: what's the difference?

SEM and TEM: what's the difference?

In this blog we briefly describe the similarities and differences between the two main types of electron microscopes: Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM).

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SEM: Electron types

In this blog we will describe the different types of electrons that are produced in a SEM, how they are detected and the type of information that they can provide.

Principles of Scanning Electron Microscopy

In this blog, we will answer the questions "How does an electron lens work? And which kind of lenses exist? How are lenses combined to form an electron column?" and give a general insight into the working principle of an electron column.

Best practices for failure analysis with SEM

The aim of this blog is to demonstrate the best practices for SEM Failure Analysis since Scanning electron microscopes (SEMs) are powerful tools for many failure analysis applications because they reveal micro- and nanometer-scale structural details.