In materials science, the challenge for researchers is to continually improve the quality of materials and devices being fabricated today. Understanding structural and compositional details down to the nanoscale is paramount to achieving technology advancements. Thermo Scientific DualBeam instruments are designed to deliver multi-scale, multi-dimensional insights, down to sub-nm resolution, to let researchers visualize the finest details of their sample.
New advancements in DualBeam FIB/SEM technology make it easier than ever before for researchers to prepare the thinnest, highest quality samples for atomic resolution S/TEM imaging, perform the highest quality subsurface and 3D characterization and create functional prototypes.
Register to watch our webinar and learn how our latest DualBeam portfolio offers significant improvements in:
- Ease of use
- Performance and Detection
- Sample Preparation
Brandon van Leer
Product Marketing Engineer SEM / DualBeam
Thermo Fisher Scientific
Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.