Introducing the Helios Hydra DualBeam

Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples?

Are you trying to uncover the highest quality subsurface information from the most challenging samples?

The new Thermo Scientific Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization. Now, you can also perform fundamental research on the interactions of different ions with matter.

Switching between argon, nitrogen, oxygen and xenon is easy and can be done in under ten minutes without sacrificing performance. This unprecedented flexibility significantly expands the potential use cases of FIB in the exploration of ion-sample interactions and accelerates time to results. Ultimately, the Helios Hydra DualBeam enables you to better analyze your samples, improve your results, and develop new and enhanced materials.

Benefits
  • Unique capability to deliver four different ion species for materials characterization in one single instrument.
  • Easy switching between the different ion species in less than ten minutes—no need to switch between different instruments.
  • Builds on the capabilities of the Helios PFIB DualBeam—the highest performance Plasma FIB-SEM available on the market—to achieve both high-throughput milling and high-resolution imaging.Significantly advances S/TEM sample prep with the high-throughput Xe+ ion beam for site-specific, large sample preparation and subsequent final low-energy polishing with the Ar+ ion beam for highest quality, ultra-low-damage samples.
  • Enables the fastest and easiest acquisition of highest quality, large-area subsurface and 3D information at the nanometer scale. Most precise targeting of the ROI in a way more material scientists and engineers can access.
  • Improved milling performance using the most suitable ion beam for your material. Significantly improves sample quality for further characterization.
 
Applications

The Helios Hydra DualBeam features the unique ability for you to easily choose between four different ion species within one instrument—in less than ten minutes. This enables you to expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.

S/TEM sample preparation

S/TEM sample preparation

The Helios Hydra DualBeam is the first instrument of its kind to allow fast and easy switching between four different primary ion beams. Previously, the application of different beams required you to transfer the sample between instruments or conduct lengthy and complicated source exchanges. For example: stand-alone, specialized, broad-beam, argon polishers are currently a typical component of a high-quality transmission electron microscopy (TEM) sample prep workflow. With the Helios Hydra DualBeam, the focused argon beam can be applied to the sample directly after initial milling, vastly reducing transfer and processing time for the sample.

3D material characterization

The ability to perform a variety of 3D materials characterization applications is critical for obtaining complete understanding of material structure and composition. For some materials scientists, seeing not only what is at the surface but also what is below the surface is key for determining root causes of failure, analyzing the size and distribution of pores in a specimen, or accessing high contrast, three-dimensional visual data critical for evaluating grain boundaries and structural properties.

The Helios Hydra DualBeam enables you to uncover the highest quality subsurface sample information from the most challenging samples (i.e., milling with O+ ion beam to significantly improve the cut face quality on soft, non-conductive materials). The following use case shows the 3D reconstruction of an automotive oil filter casing (polymer/glass fiber composite) acquired with a Helios Hydra CX DualBeam using O+ focused ion beam and Thermo Scientific™ Auto Slice & View™ 4 (AS&V4) Software for automated serial sectioning.

Helios Hydra CX DualBeam

Helios G4 CX DualBeam for Materials Science

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The latest technological innovations of the Helios G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and Thermo Scientific's application expertise, allow the Helios G4 CX DualBeam with optional AS&V4 software for the highest-quality, fully automated acquisition of multi-modal 3D datasets.

Learn more


Helios Hydra UX DualBeam

Helios G4 UX DualBeam for Materials Science

The latest technological innovations of the Thermo Scientific™ Helios G4 DualBeam™, in combination with the easiest to use, most comprehensive software and our application expertise, allow for the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples for a wide range of materials. In order to achieve the highest quality results, final polishing with very low energy ions is required to minimize surface damage on the sample.

Learn more

Applications

The Helios Hydra DualBeam features the unique ability for you to easily choose between four different ion species within one instrument—in less than ten minutes. This enables you to expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.

S/TEM sample preparation

S/TEM sample preparation

The Helios Hydra DualBeam is the first instrument of its kind to allow fast and easy switching between four different primary ion beams. Previously, the application of different beams required you to transfer the sample between instruments or conduct lengthy and complicated source exchanges. For example: stand-alone, specialized, broad-beam, argon polishers are currently a typical component of a high-quality transmission electron microscopy (TEM) sample prep workflow. With the Helios Hydra DualBeam, the focused argon beam can be applied to the sample directly after initial milling, vastly reducing transfer and processing time for the sample.

3D material characterization

The ability to perform a variety of 3D materials characterization applications is critical for obtaining complete understanding of material structure and composition. For some materials scientists, seeing not only what is at the surface but also what is below the surface is key for determining root causes of failure, analyzing the size and distribution of pores in a specimen, or accessing high contrast, three-dimensional visual data critical for evaluating grain boundaries and structural properties.

The Helios Hydra DualBeam enables you to uncover the highest quality subsurface sample information from the most challenging samples (i.e., milling with O+ ion beam to significantly improve the cut face quality on soft, non-conductive materials). The following use case shows the 3D reconstruction of an automotive oil filter casing (polymer/glass fiber composite) acquired with a Helios Hydra CX DualBeam using O+ focused ion beam and Thermo Scientific™ Auto Slice & View™ 4 (AS&V4) Software for automated serial sectioning.

Helios Hydra CX DualBeam

Helios G4 CX DualBeam for Materials Science

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The latest technological innovations of the Helios G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and Thermo Scientific's application expertise, allow the Helios G4 CX DualBeam with optional AS&V4 software for the highest-quality, fully automated acquisition of multi-modal 3D datasets.

Learn more


Helios Hydra UX DualBeam

Helios G4 UX DualBeam for Materials Science

The latest technological innovations of the Thermo Scientific™ Helios G4 DualBeam™, in combination with the easiest to use, most comprehensive software and our application expertise, allow for the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples for a wide range of materials. In order to achieve the highest quality results, final polishing with very low energy ions is required to minimize surface damage on the sample.

Learn more