Webinar on FIB SEM for TEM sample preparation and subsurface characterization with four different plasma ion beam species.

Introducing the Helios Hydra DualBeam

Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples?

Are you trying to uncover the highest quality subsurface information from the most challenging samples?

Register to watch our recorded webinar and learn more about how the Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization.

Who should attend?

  • Researchers and engineers working in interdisciplinary research fields related to materials science.

Why should you attend?

  • See how you can expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.
  • Discover how to significantly advance your S/TEM sample preparation with the high-throughput Xe+ ion beam for site-specific, large area sample preparation and subsequent final low-energy polishing with the Ar+ ion beam for highest quality, ultra-low-damage samples.
  • Learn how to obtain the highest quality subsurface sample information from the most challenging samples.
Brandon van Leer

Speaker biography

Brandon van Leer
Product Marketing Engineer SEM / DualBeam
Thermo Fisher Scientific


Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.

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