Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples?
Are you trying to uncover the highest quality subsurface information from the most challenging samples?
Register to watch our recorded webinar and learn more about how the Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization.
Who should attend?
- Researchers and engineers working in interdisciplinary research fields related to materials science.
Why should you attend?
- See how you can expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.
- Discover how to significantly advance your S/TEM sample preparation with the high-throughput Xe+ ion beam for site-specific, large area sample preparation and subsequent final low-energy polishing with the Ar+ ion beam for highest quality, ultra-low-damage samples.
- Learn how to obtain the highest quality subsurface sample information from the most challenging samples.