Modern cutting-edge metals in the construction, transportation, and infrastructure industries are increasingly engineered at the nanoscale to enhance their durability, reliability, and cost. Even traditional processes are now augmented with microscopic inspection to determine the resulting material’s elemental and structural composition. Electron microscopy continues to evolve to meet the exacting needs of the metals industries that make analysis not only more informative but also far more rapid. Adding a Focused Ion Beam (FIB) to a Scanning Electron Microscope (SEM) takes failure analysis and interface characterization into the third dimension. The speaker will provide a comprehensive introduction to FIB SEM applications in metals analysis by using examples from a variety of industries.
In this webinar, attendees will learn:
• How to rapidly mill into the defect zone with the FIB and image the area of interest with the SEM
• How to make a series of FIB slices and see how a crack propagates in 3D through a turbine blade coating
• How to visualize changes in the microstructure across a weld in boiler steel plates
• What causes cracks in rail steel
Herman Lemmens, Thermo Fisher Scientific
Herman Lemmens earned his Ph.D. in physics in 2001 at the University of Antwerpen, Belgium using TEM to characterize phase transitions in ceramics. He joined FEI in 2007 and has been part of Thermo Fisher Scientific since 2016. Currently, he is based in Eindhoven, the Netherlands. Herman uses electron microscopy to solve problems in alloy development, battery materials, reservoir rocks, and failure analysis, and is especially interested in multiscale, multimodal workflows.