Field emission scanning electron microscopy (FEG-SEM) enables nanoparticle research that has applications in medical devices, electronics, green energy, and catalysis. FEG-SEM gives insight into a surface material’s shape, size, and chemical composition. FEG-SEM provides not only higher resolution than other scanning electron microscopy (SEM) sources (CeB6 and W) but also greater versatility. Due to the high performance at low acceleration voltage of FEG compared to other SEM electron sources, FEG-SEM makes it possible to image insulating and beam-sensitive materials without sample preparation and without damaging or obscuring nanoscale features.
The Thermo Scientific Phenom Pharos G2 Desktop SEM progresses nanomaterial research by delivering high resolutions and a wide acceleration voltage range, all in a desktop system that can fit within a lab or office. From more advanced textiles and food packaging to improved solar and wind energy, this easy-to-use instrument supports rapid innovation for a wide range of industries. The Phenom Pharos G2 Desktop SEM is intuitive to operate and highly productive, making it a versatile instrument for high-volume industrial and academic labs.
Watch this on-demand webinar to learn more about its:
- High-resolution imaging—You can obtain images with resolution below 2.0 nm, compared to 2.5 nm with the previous version.
- Expanded energy range compared with the previous model—Wider acceleration voltage range of 1–20 kV provides versatility to image a wide range of samples.
- Fast time to image—Images can be obtained in just 30 seconds for high sample throughput.
- Ease of use—Intuitive user interface on a widescreen, 24-inch monitor with presets to simplify use and reduce human error when organizing workflows.
Run time: 1 hour
Kay joined Thermo Fisher Scientific in 2006 as an SEM Demonstrator based in the NanoPort in Eindhoven, The Netherlands, and is now the Product and Application SEM Engineer responsible for the Thermo Scientific Phenom Pharos G2 FEG-SEM.