SEM particle analysis for technical cleanliness

With the growing demand for analysis of smaller particles beyond the scope of light microscopy within automotive industries, the Thermo Scientific Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy (SEM) with energy dispersive X-ray spectroscopy (EDS). EDS is a major advantage over light microscopy, as it enables chemical classification of the particles, providing greater insights into your production processes and environments.

Highlights in this application note include:

  • Quality control as a method to prevent the manufacture of parts that would not comply with quality standards
  • How the Phenom ParticleX TC Desktop SEM supports high component quality in a large company in Japan that manufactures air conditioning systems for automotive application 
    • How this collaboration enabled the identification of the source of contamination, allowing the company to operate on it before the contaminants in the part could reach critical levels

Style Sheet for Global Design System
Style Sheet for Komodo Tabs