Join us at APMC 2020 3–7 Feb 2020, Hyderabad India

Thermo Fisher Scientific is the world leader in serving science. Our mission is to enable our customers to make the world healthier, cleaner and safer. To this end, we supply innovative solutions for electron microscopy, spectroscopy and microanalysis. Our TEMs, DualBeam™ FIB/SEMs and comprehensive portfolio of SEMs, combined with software suites, take customers from questions to usable data by combining high-resolution imaging with physical, chemical, elemental, mechanical and electrical analysis across scales and modes.

We are very excited to showcase our wide range of microscopy workflow solutions at APMC 2020. Visit our booth and ask our technical experts about our demos, presentations and abstracts. Find more information or register below for our demos.

Come visit us at #P01.

Thermo Scientific™ Talos™

The Thermo Scientific™ Talos™ transmission electron microscope (TEM) is a new generation in TEM, built to deliver rapid access to 2D and 3D data so that you can concentrate on discovery. With configurations for materials research and life sciences research, the Talos TEM is a truly versatile system with many innovations that will serve your research needs for years to come.

Helios G4 (AutoTEM)

Thermo Scientific™ AutoTEM™ 5 software for DualBeam™ systems provides fast, reliable, repeatable preparation of site-specific, ultra-thin samples for high-resolution scanning/transmission electron microscopy (HR-S/TEM). AutoTEM 5 software is a unique solution on the market supporting fully automated in situ lift-out method for a wide range of materials science samples.

Micro Electron Diffraction

Micro electron diffraction (MicroED) allows fast, high-resolution 3D structure determination of small chemical compounds and biological macromolecules. Thermo Fisher Scientific now offers a complete MicroED solution that is compatible with new microscopes and can be retrofitted onto existing units.

Auto Slice and View Software

Auto Slice and View software revolutionizes raw data collection from DualBeam (FIB-SEM) instruments by automating the acquisition of high-resolution 3D images. It acquires data by milling serial sections (slices) and then imaging each slice of a user-defined volume of the sample. This software enables study of the 3D structure and composition of samples at the nanometer scale. Auto Slice and View software helps make 3D imaging faster, easier, more accurate, and cost effective. Ultimately, the results provide a better representation of all the information available from the sample volume, significantly improving laboratory productivity.