Do you need chemical information on your sample faster? Or are you working with beam-sensitive materials?

The Thermo Scientific Talos F200i scanning/transmission electron microscope (S/TEM) for high-resolution imaging and analysis applications is now available with the symmetrically positioned Dual-X Racetrack detectors developed and optimized to deliver high throughput and high quality quantification for X-Ray based chemical analysis. Our high-brightness X-FEG combined with the high-speed Dual-X EDS detectors enables researchers to analyze their materials faster and see chemical information that was previously unobtainable from beam-sensitive samples.

Dual-X Benefits

  • Velox Software enables you to easily acquire and analyze multimodal data for the most complete material characterization in one tool. Dual-X is optimized for fastest, automated, unattended EDS Tomography.
  • Symmetrically positioned Dual-X enables the highest analytical throughput and chemical analysis at lower electron doses on a wider range of samples, including beam-sensitive materials.
  • Unique EDS absorption correction in Velox Software enables the most accurate quantification – no matter the sample orientation, you always have instant access to the most accurate elemental information. 
  • Dual-X is optimized for fastest, automated, unattended EDS Tomography.
  • STEM and EDS Maps software for automated acquisition of statistically relevant data on large area images at high resolution. Data from different imaging and analysis modalities can easily be correlated including on-the-fly processing and statistics via Thermo Scientific Avizo software. 

Request Demo/Quote

Large area fast acquisition of Gold-Nickel nanoparticles

Gold-Nickel Nanoparticles - 20
Gold-Nickel Nanoparticles - 21

Example of large-area, high-resolution EDS mapping with Dual-X on gold-nickel nanoparticles, acquired in less than one minute. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.

Revealing details on Silver Nickel core-shell nanoparticles

Talos-Dual-X-Image-16
Talos-Dual-X-Image-13
Talos-Dual-X-Image-17
Talos-Dual-X-Image-19
Talos-Dual-X-Image-14
Talos-Dual-X-Image-18
Talos-Dual-X-Image-15

Example of high-resolution EDS mapping of AgNi nanoparticles which are effectively used as catalysts for reduction of nitro compounds (for example 4-nitrophenol, 4-nitroaniline) and degradation of organic dyes. The individual EDS maps reveal that system Ag0.6Ni0.4 showed the highest catalytic activity for reduction and degradation reaction of nitro compounds and organic dyes. AgNi nanoparticles are also studied as catalysts for generation of hydrogen. In this use case, the hydrogen generation rate of AgNi nanoparticles was found to be much higher compared to Ag and Ni nanoparticles of similar size. Also a single map reveals that one of the shells is actually Sulphur instead of Nickel. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.

Beam-sensitive analytics on Co-g-C3N4/Pt

Talos-Dual-X-Image-28
Talos-Dual-X-Image-29
Talos-Dual-X-Image-24
Talos-Dual-X-Image-27
Talos-Dual-X-Image-22
Talos-Dual-X-Image-258
Talos-Dual-X-Image-26
Talos-Dual-X-Image-23

Example of high-resolution EDS mapping of beam-sensitive material used for photocatalytic hydrogen evolution. The small nanoparticles (Pt) act as active sites for the photocatalytic reaction. These nanoparticles are studied to observe the structure of Co-g-C3N4 loaded with Pt nanoparticles and find the relationship between the position of Co atoms and Pt nanoparticles to analyze the reason for improved photocatalytic activity of this sample. In this experiment, it was assumed that Co should be atomically dispersed or located with a diameter of less than 1 nm (single atomic dispersion) on the surface of g-C3N4, and that the Pt nanoparticles should be deposited on the surface of Co-g-C3N4. This was confirmed by the results of elemental mapping data. Sample courtesy of Prof. ShengChun Yang, Xi’an Jiaotong University, China.

Talos F200i for Materials Science

Talos F200i for Materials Science

The Thermo Scientific Talos F200i S/TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.

Product info

 

Webinar: Introducing the Talos F200i S/TEM with Dual-X

Do you need chemical information on your sample faster? Or are you working with beam sensitive materials?

Register below to watch our recorded webinar (~15 minutes) and learn more about how the Talos F200i with Dual-X significantly improves throughput and quantification for X-Ray based chemical analysis

Why should I attend?

  • See how Dual-X technology on Talos F200i enables the highest analytical throughput and chemical analysis at lower electron doses on a wider range of samples, including beam-sensitive materials.
  • Discover how unique EDS absorption correction in Velox Software enables the most accurate quantification – no matter the sample orientation, you always have instant access to the most accurate elemental information
  • Learn how to use Talos in the most efficient way through automated overnight analysis for instant access to your data in the morning and generating statistically relevant data on large area images in different imaging and analysis modalities

Who should attend?

  • Materials Scientists needing fast easy chemical characterization down to sub-nm nanoparticles
  • Materials Scientists needing chemical analysis of beam sensitive materials
Yuri Rikers

Speaker biography
Yuri Rikers, Product Marketing Manager

Ir. Yuri G.M. Rikers studied Applied Physics at the Eindhoven University of Technology. He started working at Thermo Fisher Scientific in 2002 as a Service & Applications specialist TEM in the Technical Support Group. Since 2007, he has been working in the Thermo Fisher Scientific NanoPort in Eindhoven as Sr. Applications Specialist TEM, mainly supporting the Tecnai, Titan and Talos product series for the Materials Science Business Unit. In late 2015, Yuri started working as a Product Marketing Manager for the TEM division of the Materials Science Business Unit.

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 Speak to an Account Manager
 Schedule a demo
 Request a quote

To ensure that we are complying with your preferences, we need to confirm permission to send you communications by email. Personal information provided will be used in accordance with our Privacy Policy.

 Please confirm you would like to receive marketing and promotional email messages about Thermo Fisher Scientific™ products and services.
 
 

Large area fast acquisition of Gold-Nickel nanoparticles

Gold-Nickel Nanoparticles - 20
Gold-Nickel Nanoparticles - 21

Example of large-area, high-resolution EDS mapping with Dual-X on gold-nickel nanoparticles, acquired in less than one minute. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.

Revealing details on Silver Nickel core-shell nanoparticles

Talos-Dual-X-Image-16
Talos-Dual-X-Image-13
Talos-Dual-X-Image-17
Talos-Dual-X-Image-19
Talos-Dual-X-Image-14
Talos-Dual-X-Image-18
Talos-Dual-X-Image-15

Example of high-resolution EDS mapping of AgNi nanoparticles which are effectively used as catalysts for reduction of nitro compounds (for example 4-nitrophenol, 4-nitroaniline) and degradation of organic dyes. The individual EDS maps reveal that system Ag0.6Ni0.4 showed the highest catalytic activity for reduction and degradation reaction of nitro compounds and organic dyes. AgNi nanoparticles are also studied as catalysts for generation of hydrogen. In this use case, the hydrogen generation rate of AgNi nanoparticles was found to be much higher compared to Ag and Ni nanoparticles of similar size. Also a single map reveals that one of the shells is actually Sulphur instead of Nickel. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.

Beam-sensitive analytics on Co-g-C3N4/Pt

Talos-Dual-X-Image-28
Talos-Dual-X-Image-29
Talos-Dual-X-Image-24
Talos-Dual-X-Image-27
Talos-Dual-X-Image-22
Talos-Dual-X-Image-258
Talos-Dual-X-Image-26
Talos-Dual-X-Image-23

Example of high-resolution EDS mapping of beam-sensitive material used for photocatalytic hydrogen evolution. The small nanoparticles (Pt) act as active sites for the photocatalytic reaction. These nanoparticles are studied to observe the structure of Co-g-C3N4 loaded with Pt nanoparticles and find the relationship between the position of Co atoms and Pt nanoparticles to analyze the reason for improved photocatalytic activity of this sample. In this experiment, it was assumed that Co should be atomically dispersed or located with a diameter of less than 1 nm (single atomic dispersion) on the surface of g-C3N4, and that the Pt nanoparticles should be deposited on the surface of Co-g-C3N4. This was confirmed by the results of elemental mapping data. Sample courtesy of Prof. ShengChun Yang, Xi’an Jiaotong University, China.

Talos F200i for Materials Science

Talos F200i for Materials Science

The Thermo Scientific Talos F200i S/TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.

Product info

 

Webinar: Introducing the Talos F200i S/TEM with Dual-X

Do you need chemical information on your sample faster? Or are you working with beam sensitive materials?

Register below to watch our recorded webinar (~15 minutes) and learn more about how the Talos F200i with Dual-X significantly improves throughput and quantification for X-Ray based chemical analysis

Why should I attend?

  • See how Dual-X technology on Talos F200i enables the highest analytical throughput and chemical analysis at lower electron doses on a wider range of samples, including beam-sensitive materials.
  • Discover how unique EDS absorption correction in Velox Software enables the most accurate quantification – no matter the sample orientation, you always have instant access to the most accurate elemental information
  • Learn how to use Talos in the most efficient way through automated overnight analysis for instant access to your data in the morning and generating statistically relevant data on large area images in different imaging and analysis modalities

Who should attend?

  • Materials Scientists needing fast easy chemical characterization down to sub-nm nanoparticles
  • Materials Scientists needing chemical analysis of beam sensitive materials
Yuri Rikers

Speaker biography
Yuri Rikers, Product Marketing Manager

Ir. Yuri G.M. Rikers studied Applied Physics at the Eindhoven University of Technology. He started working at Thermo Fisher Scientific in 2002 as a Service & Applications specialist TEM in the Technical Support Group. Since 2007, he has been working in the Thermo Fisher Scientific NanoPort in Eindhoven as Sr. Applications Specialist TEM, mainly supporting the Tecnai, Titan and Talos product series for the Materials Science Business Unit. In late 2015, Yuri started working as a Product Marketing Manager for the TEM division of the Materials Science Business Unit.

* Required field

*
*
*
*
 
 Speak to an Account Manager
 Schedule a demo
 Request a quote

To ensure that we are complying with your preferences, we need to confirm permission to send you communications by email. Personal information provided will be used in accordance with our Privacy Policy.

 Please confirm you would like to receive marketing and promotional email messages about Thermo Fisher Scientific™ products and services.