FIB SEM (DualBeam) preparation of a lamella for TEM analysis.

The new Thermo Scientific Helios 5 DualBeam builds on the high-performance imaging and analysis capabilities of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of materials science researchers and engineers for the widest range of FIB-SEM use cases – even on the most challenging samples.

The Helios 5 DualBeam redefines the standard in high-resolution imaging with highest materials contrast; fastest, easiest and most precise high-quality sample preparation for S/TEM imaging and Atom Probe Tomography (APT) as well as the highest-quality subsurface and 3D characterization. Building on the proven capabilities of the Helios DualBeam family, additional advancements to the new Helios 5 DualBeam were designed to ensure the system is optimized for a variety of manual or automated workflows. Those improvements include:

  • Greater ease-of-use: Helios 5 is the most accessible DualBeam for users of all experience levels. Operator training may be reduced from months to days and the system design is helping all operators to achieve consistent, repeatable results on a wide variety of advanced applications. 
  • Increased productivity: Advanced automation capabilities, increased robustness and stability enhancements in the Helios 5 and AutoTEM 5 software can significantly increase the sample preparation throughput by allowing unattended and even overnight operation. 
  • Improved time to results: The Helios 5 DualBeam now includes FLASH, a new concept of tuning the image. With conventional microscopes, each time an operator needs to acquire an image, the microscope has to be carefully tuned by iterative alignments. With the Helios 5 DualBeam, a simple gesture across the screen will activate FLASH, which automatically adjusts these parameters. The automatic adjustments can significantly improve throughput, data quality, and simplify the acquisition of high-quality images.

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Applications

Highest-quality, ultra-thin S/TEM sample preparation

Sample preparation for S/TEM analysis is still considered to be one of the most critical but challenging and time-consuming tasks in materials characterization labs. The latest technological innovations of Helios 5 DualBeam, in combination with the easiest to use, most automated AutoTEM 5 Software and Thermo Fisher Scientific application expertise, allow users of all experience levels to achieve the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples for a wide range of materials. AutoTEM 5 Software enables unattended, fully automated TEM sample preparation workflow and supports various use cases, including top-down, inverted and planar geometries.

FIB SEM (DualBeam) prepared lamella imaged with STEM.

60kV HR-STEM image of highest-quality, ultra-thin lamella (<100> SrTiO3) produced with Helios 5 UX DualBeam.

Highest quality subsurface and 3D characterization

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. Helios 5 DualBeam with optional Thermo Scientific™ Auto Slice & View™ 4 Software allows for the highest-quality, fully automated acquisition of multi-modal 3D datasets, including, among others, BSE imaging for maximum materials contrast, energy dispersive spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) for microstructural and crystallographic information. Combined with Thermo Scientific™ Avizo™ Software, it delivers a unique workflow solution for highest-resolution, advanced 3D characterization and analysis at the nanometer scale.

High-quality, high resolution 3D characterization of a ceramic sample acquired with a Helios DualBeam and reconstructed using Avizo Software. Data is segmented to analyze the distribution of different phases in the sample. Sample courtesy of KAIST.

3D Nanoprototyping

Devices and structures made on a nanoscale have numerous real-world applications, and the potential for further development and uptake is still growing. However, converting the latest ideas and designs into something real for research, testing and prototyping can pose a significant technical barrier. Designed for the most challenging electron microscopy tasks in materials science, the Helios 5 DualBeam provides the capability for rapid, precise milling and deposition of the most varied and intricate structures, whether it’s devices with critical dimensions of less than 10 nm or multiple patterns written over a large area.

FIB SEM (DualBeam) used to prepare nano-fluidic system.

Nano-fluidic system made with a multi-layer pattern using a Helios DualBeam and NanoBuilder Software. Here deposition of a platinum heating strip and milling of nano-fluidic channel have been made with one single automated process.

Helios 5 DualBeam Products

Helios5-CX-product-image

Helios 5 CX

  • Tomahawk HT FIB with 100nA
  • Elstar NG SEM
  • Highly flexible 110 mm stage

Helios-5-UC-product-image

Helios 5 UC

  • Tomahawk HT FIB with 100nA
  • Elstar UC+ SEM for improved low kV SEM extreme high-resolution imaging of beam sensitive materials
  • Highly stable & accurate 150 mm Piezo stage

Helios-5-UX-product-image

Helios 5 UX

  • Phoenix FIB with superior performance at lowest energy for fastest and easiest high-quality sample preparation
  • Elstar UC+ SEM for improved low kV SEM extreme high-resolution imaging of beam sensitive materials
  • Highly stable & accurate 150 mm Piezo stage
  • ICE detector

On-demand webinar

The new Thermo Scientific Helios 5 DualBeam builds on the high-performance imaging and analysis capabilities of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of materials science researchers and engineers for the widest range of FIB-SEM use cases – even on the most challenging samples.

The Helios 5 DualBeam redefines the standard in high-resolution imaging with highest materials contrast; fastest, easiest and most precise high-quality sample preparation for S/TEM imaging and Atom Probe Tomography (APT) as well as the highest-quality subsurface and 3D characterization.

Register for our recorded webinar (~17 minutes) and learn how additional advancements to the new Helios 5 were designed to ensure the system is optimized for a variety of manual or automated workflows.

Who should attend?

  • Researchers and engineers working in interdisciplinary research fields related to materials science.

Why should you attend?

  • Discover how greater ease-of-use makes Helios 5 is the most accessible DualBeam for users of all experience levels.
  • Learn how advanced automation capabilities, increased robustness and stability enhancements in the Helios 5 and AutoTEM 5 software can significantly increase the sample preparation throughput by allowing unattended and even overnight operation. 
Brandon&#x20;van&#x20;Leer

Speaker biography

Brandon van Leer
Product Marketing Engineer SEM / DualBeam
Thermo Fisher Scientific

 

Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.

Fill out the form below to for access to this valuable webinar

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Applications

Highest-quality, ultra-thin S/TEM sample preparation

Sample preparation for S/TEM analysis is still considered to be one of the most critical but challenging and time-consuming tasks in materials characterization labs. The latest technological innovations of Helios 5 DualBeam, in combination with the easiest to use, most automated AutoTEM 5 Software and Thermo Fisher Scientific application expertise, allow users of all experience levels to achieve the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples for a wide range of materials. AutoTEM 5 Software enables unattended, fully automated TEM sample preparation workflow and supports various use cases, including top-down, inverted and planar geometries.

FIB SEM (DualBeam) prepared lamella imaged with STEM.

60kV HR-STEM image of highest-quality, ultra-thin lamella (<100> SrTiO3) produced with Helios 5 UX DualBeam.

Highest quality subsurface and 3D characterization

Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. Helios 5 DualBeam with optional Thermo Scientific™ Auto Slice & View™ 4 Software allows for the highest-quality, fully automated acquisition of multi-modal 3D datasets, including, among others, BSE imaging for maximum materials contrast, energy dispersive spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) for microstructural and crystallographic information. Combined with Thermo Scientific™ Avizo™ Software, it delivers a unique workflow solution for highest-resolution, advanced 3D characterization and analysis at the nanometer scale.

High-quality, high resolution 3D characterization of a ceramic sample acquired with a Helios DualBeam and reconstructed using Avizo Software. Data is segmented to analyze the distribution of different phases in the sample. Sample courtesy of KAIST.

3D Nanoprototyping

Devices and structures made on a nanoscale have numerous real-world applications, and the potential for further development and uptake is still growing. However, converting the latest ideas and designs into something real for research, testing and prototyping can pose a significant technical barrier. Designed for the most challenging electron microscopy tasks in materials science, the Helios 5 DualBeam provides the capability for rapid, precise milling and deposition of the most varied and intricate structures, whether it’s devices with critical dimensions of less than 10 nm or multiple patterns written over a large area.

FIB SEM (DualBeam) used to prepare nano-fluidic system.

Nano-fluidic system made with a multi-layer pattern using a Helios DualBeam and NanoBuilder Software. Here deposition of a platinum heating strip and milling of nano-fluidic channel have been made with one single automated process.

Helios 5 DualBeam Products

Helios5-CX-product-image

Helios 5 CX

  • Tomahawk HT FIB with 100nA
  • Elstar NG SEM
  • Highly flexible 110 mm stage

Helios-5-UC-product-image

Helios 5 UC

  • Tomahawk HT FIB with 100nA
  • Elstar UC+ SEM for improved low kV SEM extreme high-resolution imaging of beam sensitive materials
  • Highly stable & accurate 150 mm Piezo stage

Helios-5-UX-product-image

Helios 5 UX

  • Phoenix FIB with superior performance at lowest energy for fastest and easiest high-quality sample preparation
  • Elstar UC+ SEM for improved low kV SEM extreme high-resolution imaging of beam sensitive materials
  • Highly stable & accurate 150 mm Piezo stage
  • ICE detector

On-demand webinar

The new Thermo Scientific Helios 5 DualBeam builds on the high-performance imaging and analysis capabilities of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of materials science researchers and engineers for the widest range of FIB-SEM use cases – even on the most challenging samples.

The Helios 5 DualBeam redefines the standard in high-resolution imaging with highest materials contrast; fastest, easiest and most precise high-quality sample preparation for S/TEM imaging and Atom Probe Tomography (APT) as well as the highest-quality subsurface and 3D characterization.

Register for our recorded webinar (~17 minutes) and learn how additional advancements to the new Helios 5 were designed to ensure the system is optimized for a variety of manual or automated workflows.

Who should attend?

  • Researchers and engineers working in interdisciplinary research fields related to materials science.

Why should you attend?

  • Discover how greater ease-of-use makes Helios 5 is the most accessible DualBeam for users of all experience levels.
  • Learn how advanced automation capabilities, increased robustness and stability enhancements in the Helios 5 and AutoTEM 5 software can significantly increase the sample preparation throughput by allowing unattended and even overnight operation. 
Brandon&#x20;van&#x20;Leer

Speaker biography

Brandon van Leer
Product Marketing Engineer SEM / DualBeam
Thermo Fisher Scientific

 

Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.

Fill out the form below to for access to this valuable webinar

* Required

*
*
 
 
 
 
 Speak to an Account Manager
 Schedule a demo
 Request a quote

To ensure that we are complying with your preferences, we need to confirm permission to send you communications by email. Personal information provided will be used in accordance with our Privacy Policy.

 Please confirm you would like to receive marketing and promotional email messages about Thermo Fisher Scientific™ products and services.