Helios-Hydra-476x225

The new Thermo Scientific Helios Hydra DualBeam delivers four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as S/TEM sample preparation and 3D materials characterization.

Switching between argon, nitrogen, oxygen and xenon is easy and can be done in under ten minutes without sacrificing performance. This unprecedented flexibility significantly expands the potential application space of FIB and enables research of ion-sample interactions to optimize the existing use cases.

Benefits

  • Unique capability to deliver four different ion species for materials characterization in one single instrument.
  • Easy switching between the different ion species in less than ten minutes.
  • Builds on the capabilities of the Helios PFIB DualBeam—the highest performance Plasma FIB-SEM available on the market—to achieve both high-throughput milling and high-resolution imaging.
  • Significantly advances S/TEM sample prep with the high throughput Xe+ ion beam for site-specific, large sample preparation and subsequent final low-energy polishing with the Ar+ ion beam for highest quality, ultra-low-damage samples.
  • Enhances high quality processing of carbon-based materials, such as polymers, diamond or biological samples with O+ ion beam.
  • Enables the fastest and easiest acquisition of highest quality, large-area subsurface and 3D information at the nanometer scale.
  • Improved milling performance using the most suitable ion beam for your material, significantly improving sample quality for further characterization.

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Applications

The Helios Hydra DualBeam features the unique ability for you to easily choose between four different ion species within one instrument—in less than ten minutes. This enables you to expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.

S/TEM sample preparation

The Helios Hydra DualBeam is the first instrument of its kind to allow fast and easy switching between four different primary ion beams. Previously, the application of different beams required you to transfer the sample between instruments or conduct lengthy and complicated source exchanges. For example: stand-alone, specialized, broad-beam, argon polishers are currently a typical component of a high-quality transmission electron microscopy (TEM) sample prep workflow. With the Helios Hydra DualBeam, the focused argon beam can be applied to the sample directly after initial milling, vastly reducing transfer and processing time for the sample.

S/TEM sample preparation
HR S/TEM image of a highest quality Si lamella prepared with Helios Hydra DualBeam using Ar FIB for the final polishing.

3D material characterization

The ability to perform a variety of 3D materials characterization applications is critical for obtaining complete understanding of material structure and composition. For some materials scientists, seeing not only what is at the surface but also what is below the surface is key for determining root causes of failure, analyzing the size and distribution of pores in a specimen, or accessing high contrast, three-dimensional visual data critical for evaluating grain boundaries and structural properties.

The Helios Hydra DualBeam enables you to uncover the highest quality subsurface sample information from the most challenging samples (i.e., milling with O+ ion beam to significantly improve the cut face quality on soft, non-conductive materials). The following use case shows the 3D reconstruction of an automotive oil filter casing (polymer/glass fiber composite) acquired with a Helios Hydra CX DualBeam using O+ focused ion beam and Thermo Scientific Auto Slice & View™ 4 (AS&V4) Software for automated serial sectioning.

Helios Hydra CX DualBeam

Helios Hydra DualBeam

The Thermo Scientific Helios™ Hydra DualBeam combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar™ SEM Column to provide the most advanced focused ion- and electron-beam performance. Intuitive software and an unprecedented level of automation and ease-of-use allow observation and analysis of relevant subsurface volumes.

Product Models:

Webinar: Introducing the Helios Hydra DualBeam

Duration: 16:04

Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples?

Are you trying to uncover the highest quality subsurface information from the most challenging samples?

Register below to watch our recorded webinar and learn more about how the Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization.

Who should attend?

  • Researchers and engineers working in interdisciplinary research fields related to materials science.

Why should you attend?

  • See how you can expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.
  • Discover how to significantly advance your S/TEM sample preparation with the high-throughput Xe+ ion beam for site-specific, large area sample preparation and subsequent final low-energy polishing with the Ar+ ion beam for highest quality, ultra-low-damage samples.
  • Learn how to obtain the highest quality subsurface sample information from the most challenging samples.
Brandon van Leer

Speaker biography

Brandon van Leer
Product Marketing Engineer SEM / DualBeam
Thermo Fisher Scientific

 

Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.

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Applications

The Helios Hydra DualBeam features the unique ability for you to easily choose between four different ion species within one instrument—in less than ten minutes. This enables you to expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.

S/TEM sample preparation

The Helios Hydra DualBeam is the first instrument of its kind to allow fast and easy switching between four different primary ion beams. Previously, the application of different beams required you to transfer the sample between instruments or conduct lengthy and complicated source exchanges. For example: stand-alone, specialized, broad-beam, argon polishers are currently a typical component of a high-quality transmission electron microscopy (TEM) sample prep workflow. With the Helios Hydra DualBeam, the focused argon beam can be applied to the sample directly after initial milling, vastly reducing transfer and processing time for the sample.

S/TEM sample preparation
HR S/TEM image of a highest quality Si lamella prepared with Helios Hydra DualBeam using Ar FIB for the final polishing.

3D material characterization

The ability to perform a variety of 3D materials characterization applications is critical for obtaining complete understanding of material structure and composition. For some materials scientists, seeing not only what is at the surface but also what is below the surface is key for determining root causes of failure, analyzing the size and distribution of pores in a specimen, or accessing high contrast, three-dimensional visual data critical for evaluating grain boundaries and structural properties.

The Helios Hydra DualBeam enables you to uncover the highest quality subsurface sample information from the most challenging samples (i.e., milling with O+ ion beam to significantly improve the cut face quality on soft, non-conductive materials). The following use case shows the 3D reconstruction of an automotive oil filter casing (polymer/glass fiber composite) acquired with a Helios Hydra CX DualBeam using O+ focused ion beam and Thermo Scientific Auto Slice & View™ 4 (AS&V4) Software for automated serial sectioning.

Helios Hydra CX DualBeam

Helios Hydra DualBeam

The Thermo Scientific Helios™ Hydra DualBeam combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar™ SEM Column to provide the most advanced focused ion- and electron-beam performance. Intuitive software and an unprecedented level of automation and ease-of-use allow observation and analysis of relevant subsurface volumes.

Product Models:

Webinar: Introducing the Helios Hydra DualBeam

Duration: 16:04

Do you often struggle to prepare high-quality, ultra-low-damage S/TEM samples?

Are you trying to uncover the highest quality subsurface information from the most challenging samples?

Register below to watch our recorded webinar and learn more about how the Helios Hydra DualBeam delivers four different ions as the primary beam, allowing you to choose the ion species that provide the best S/TEM sample prep and 3D material characterization.

Who should attend?

  • Researchers and engineers working in interdisciplinary research fields related to materials science.

Why should you attend?

  • See how you can expand and optimize the application space for investigating material properties across length scales and on a wide variety of materials.
  • Discover how to significantly advance your S/TEM sample preparation with the high-throughput Xe+ ion beam for site-specific, large area sample preparation and subsequent final low-energy polishing with the Ar+ ion beam for highest quality, ultra-low-damage samples.
  • Learn how to obtain the highest quality subsurface sample information from the most challenging samples.
Brandon van Leer

Speaker biography

Brandon van Leer
Product Marketing Engineer SEM / DualBeam
Thermo Fisher Scientific

 

Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.

* Required field

*
*
 
 
 
 
 Speak to an Account Manager
 Schedule a demo
 Request a quote

To ensure that we are complying with your preferences, we need to confirm permission to send you communications by email. Personal information provided will be used in accordance with our Privacy Policy.

 Please confirm you would like to receive marketing and promotional email messages about Thermo Fisher Scientific™ products and services.