Portable XRF Analyzer Product Features
GPS, GIS and Data Management Solutions

Embedded GPS
The Thermo Scientific™ Niton™ XL5 and Thermo Scientific™ Niton™ XL3 Analyzers provide GPS functionality with an embedded chip-set comparable to the most commonly used geological GPS systems, or by Bluetooth™ (with the Thermo Scientific™ Niton™ XL2 Analyzer), to your existing portable external GPS instruments..

Mobile GIS Hardware
We partner with Trimble, the market leader for external GPS, to provide you with a package that combines precise location coordinates with geochemical data, mobile GIS, and workflow solutions in a single process to ensure data integrity and time savings.

Mobile GIS Software
Instantly translate valuable geochemical data into maps or logs to visually see areas for infill sampling, drilling or more detailed investigation using Discover Mobile™ (from Pitney Bowes) or ArcPad® (from Esri) mobile GIS software packages.

Other full-featured PC-based GIS software can be used as well. Geochemical data and corresponding GPS coordinates can be exported through the propriety Thermo Scientific™ NDT™ translator and converted into various formats (CSV, TAB, SHP, GMT, GML, KML) for routing to commercially available mobile GIS software platforms, or to full-version PC-based GIS software solutions. In addition, using NDT translator, the data can be saved as KML file, which is opened in Google Earth to view location of analysis points as well as analytical data.

Data Management
Integrating the XRF data with all other exploration data in a spatial context is critical for informed decision making. We’re working on integration with software providers (i.e. Geosoft, Maxwell, etc.) for post-processing of exploration data.

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Save time and streamline workflow utilizing WiFi on the Niton XL5 XRF analyzer. Offering users the ability to automatically transfer data from the analyzer onto to a specified network folder, WiFi enables greater connectivity for your business.

NitonConnect PC Software

Newly released Thermo Scientific™ NitonConnect PC Software is only available on the Niton XL5 XRF analyzer. Building on the industry standard set by the NDT Software Suite (available on other Niton instruments), NitonConnect enables remote operation, wireless data transfer and software updates via the Customer Support Portal.

NitonConnect features three modules for optimized operation of the Niton XL5 analyzer:

NitonConnect Data – Connect the analyzer to a PC using a USB connector or Bluetooth adapter and transfer data and programs.

NitonConnect Remote – Select a connected analyzer by serial number and operate the instrument benchtop style through the PC.

NitonConnect Sync Manager – Sync the analyzer to the Customer Support Portal to update software, enable calibrations and receive remote troubleshooting.

Niton Data Transfer (NDT)
RF Product Features NDT
XRF Product Features NDT2

The Niton Data Transfer (NDT) Software Suite features a set of data management tools to meet the requirements of different testing applications, including metal alloy analysis for manufacturing and scrap metal recycling; RoHS, WEEE and other compliance testing; mineral exploration and mining; environmental site assessments; and lead paint inspections.

NDT provides the following modules for different data management tasks:

  • Instrument setup
  • Downloading and managing data
  • Managing user passwords and permissions
  • Comparing and analyzing sample x-ray spectra
  • Designing and printing reports and certificates
  • Creating and editing metal alloy grade libraries
  • Developing empirical calibrations
  • Installing software upgrades
Geometrically Optimized Large Drift Detector (GOLDD) Technology
Product Features GOLDD

Thermo Scientific™ GOLDD technology offers superior performance for light element analysis with the lowest limits of detection and fastest measurement times available - up to 10 times faster than conventional Si-PIN detectors, and up to 3 times more precise than conventional smaller, silicon drift detectors. With GOLDD technology, Niton analyzers can effectively measure elements as low as Mg without the use of helium purging or vacuum pumps.

Fundamentally, silicon drift detectors have the capacity to process more counting events than Si-PIN detectors traditionally used in handheld and field-mobile XRF analyzers. Unless the instrument has been engineered to take advantage of these counting events, it squanders the opportunity to provide dramatically improved analytical performance. With GOLDD optimized geometry, Niton analyzers employ some of the largest area drift detectors that are commercially available in a portable XRF analyzer, enabling them to collect up to 2.5x more signal and process over 180,000 detector events per second.

Silicon Drift Detectors (SDDs)
XRF Product Features SDD

The introduction of silicon drift detectors (SDD) into handheld XRF instruments has produced significant performance improvements over traditional XRF capabilities. SDDs are high-resolution detectors that can be used in high count-rate applications. The larger the active area of the detector, the more efficiently it can gather and process x-ray counts. XRF instrumentation employing SDD can be used in applications that require extreme sensitivity, such as the detection of tramp elements in alloys that can degrade material  performance. Residual elements can be measured with the degree of confidence once only possible in the lab. SDD’s are also required to analyze light elements such as Magnesium (Mg), Aluminum (Al), Silicon (Si), Phosphorus (P) andand Sulfur (S).

Integrated Camera for Image Capturing and Analysis
XRF Product Features Integrated Camera

A high-performance integrated camera has been added as a standard feature on most Niton XRF analyzers. The camera allows users in industries such as aerospace, oil and gas, and transportation to identify the correct point to analyze metals, including on a specific weld spot or alloy joint. Scrap yard, metal fabrication and non-destructive testing personnel who conduct elemental and alloy analysis using X-ray fluorescence (XRF) can more accurately position the instrument on the sample area of interest to capture and store an image for review or inclusion in reports. For analysis of inhomogeneous samples, accurate positioning is essential to ensure the area of interest is analyzed thoroughly for its elemental composition.