Today’s automotive parts have seen incredible advances in the functionality and reliability of transmissions, fuel injection systems, power trains, and braking systems. These improvements are the result of fundamental advances in the materials used in automotive manufacturing, including novel, increasingly complex steel, glass, ceramic, and polymer materials.

These improvements, however, also come with new challenges. For example, high-precision automotive parts are more susceptible to residual, micron-size particulate contamination, which results in component, or potentially even system, failure. To make matters worse, current analytical techniques are often inadequate (too low resolution) to help engineers determine the cause of these failures.

New vehicles also undergo extensive testing to ensure the production of reliable, quality automobiles along with further improvements to current materials and processes.  For instance, the increasing demand for affordable, fuel-efficient tires requires better test methods to develop and study new rubber formulations. The next generation of rubber compounds has to reduce road resistance while still yielding a quality end product in order to substantially impact fuel efficiency. This starts with detailed analytical assessment using techniques such as electron microscopy.  

Thermo Fisher Scientific provides a range of instrumentation and software that simplifies your automotive materials analysis. These tools also have the potential to greatly reduce production times as you bring the quality control process in-house. By no longer relying on outsourcing for your QC analysis, production-cycle time can decrease by up to ten-fold.

Aluminum mineral grain found during SEM analysis of an automotive component
SEM image of an aluminum mineral grain found during the analysis of an automotive component.
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Aluminum chip found during SEM imaging of an automotive component.
Aluminum chip found during imaging and analysis of an automotive component.
Aluminum debris generated during wear of a part, imaged with SEM.
SEM image of aluminum debris generated due to wear of a part as it was used. Debris provides valuable information on part degradation and cleanliness over time.
Aluminum shaving found with SEM during cleanliness analysis of an automotive material.
SEM image of an aluminum shaving found during cleanliness analysis of an automotive material. Size, morphology and chemistry provide valuable insight to the origin and initiating processes of particles found during testing.
Mineral fiber found during SEM analysis.
SEM image of mineral fiber found during investigative analysis.
Aluminum chip found during SEM imaging of an automotive component.
Aluminum chip found during imaging and analysis of an automotive component.
Aluminum debris generated during wear of a part, imaged with SEM.
SEM image of aluminum debris generated due to wear of a part as it was used. Debris provides valuable information on part degradation and cleanliness over time.
Aluminum shaving found with SEM during cleanliness analysis of an automotive material.
SEM image of an aluminum shaving found during cleanliness analysis of an automotive material. Size, morphology and chemistry provide valuable insight to the origin and initiating processes of particles found during testing.
Mineral fiber found during SEM analysis.
SEM image of mineral fiber found during investigative analysis.

Applications

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Aluminum mineral grain found with SEM during parts cleanliness testing

Cleanliness
 

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

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Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

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In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

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Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

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Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Products

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Apreo SEM

  • High-performance SEM for all-round nanometer or sub-nanometer resolution
  • In-column T1 backscatter detector for sensitive, TV-rate materials contrast
  • Excellent performance at long working distance (10 mm)

Quattro ESEM

  • Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM)
  • Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation

Prisma E SEM

  • Entry-level SEM with excellent image quality
  • Easy and quick sample loading and navigation for multiple samples
  • Compatible with a wide range of materials thanks to dedicated vacuum modes

Phenom Pharos Desktop SEM

  • FEG source with 2 up to 15 kV acceleration voltage range
  • <2.5 nm (SE) and <4.0 nm (BSE) resolution @ 15 kV; up to 1,000,000x magnification
  • Optional fully integrated EDS and SE detector

Phenom XL G2 Desktop SEM

  • For large samples (100x100 mm) and ideal for automation
  • <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage
  • Optional fully integrated EDS and BSE detector

Phenom ProX Desktop SEM

  • High performance desktop SEM with integrated EDS detector
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector
 
 

Phenom ParticleX TC Desktop SEM

  • Versatile desktop SEM with automation software for Technical Cleanliness
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Avizo Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

AutoScript 4

  • improved reproducibility and accuracy
  • Unattended, high throughput imaging and patterning
  • Supported by Python 3.5-based scripting environment

PoroMetric

  • Correlate pore features such as area, aspect ratio, major and minor axis
  • Acquire images directly from the Desktop SEM
  • Statistical data with high-quality images

ParticleMetric

  • Integrated software in ProSuite for online and offline analysis
  • Correlating particle features such as diameter, circularity, aspect ratio and convexity
  • Creating image datasets with Automated Image Mapping

FiberMetric

  • Save time by automated measurements
  • Fast and automated collection of all statistical data
  • View and measure micro and nano fibers with unmatched accuracy

Filter Inserts

  • Filter residue analysis and asbestos analysis
  • Available in two models which support 47 mm (1.85 inch) and 25 mm (1 inch) filters
  • Use on Phenom Desktop SEM

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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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