Paint coating scratch test imaged on the Helios DualBeam
Site-specific cross-section for scratch testing and adhesion of a paint coating,
performed on a Helios G4 PFIB DualBeam.

Modern materials characterization is increasingly reliant on sub-surface characterization for a more comprehensive understanding of the material’s structure and physical properties. Cross-sectioning with a DualBeam instrument, which combines a focused ion beam with a scanning electron microscope (FIB-SEM), allows you to mill the material with FIB and perform high-resolution SEM imaging at nanometer scale. In failure analysis, for instance, this allows for defects to be located under the surface, making DualBeams instruments ideal for identification of the root cause of failures.

Along with high-resolution SEM imaging, cross-section characterization on the DualBeam can be expanded with back-scattered electron (BSE) imaging for maximum materials contrast, energy-dispersive X-ray spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) for microstructural and crystallographic information.

Additionally, with the introduction of the Thermo Scientific Helios 5 Hydra DualBeam, we now offer the flexibility of argon, oxygen, xenon, and nitrogen ion species in one instrument, allowing you to choose the best FIB type for each of your experiments. Xenon ions are well suited for high-throughput removal of various materials, like metals and ceramics, whereas oxygen ions provide superior milling quality for carbon-based samples. In case extremely large volume characterization is needed, the Thermo Scientific Helios 5 Laser PFIB System is an additional solution. It enables high-throughput cross-sectioning up to millimeter scale, as well as processing of materials that are typically challenging for ion beams (e.g. charging or beam sensitive samples). We combine these unique DualBeam capabilities with our versatile software solutions to bring you a range of workflows for advanced 3D characterization and high-resolution analysis at the nanometer scale.

Applications

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Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Oil and Gas

As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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Geological Research

Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.

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Products

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Helios Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging

Helios 5 DualBeam

  • Fully automated, high-quality, ultra-thin TEM sample preparation
  • High throughput, high resolution subsurface and 3D characterization
  • Rapid nanoprototyping capabilities

Helios 5 PFIB DualBeam

  • Gallium-free STEM and TEM sample preparation
  • Multi-modal subsurface and 3D information
  • Next-generation 2.5 μA xenon plasma FIB column

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

Auto Slice and View 4.0 Software

  • Automated serial sectioning for DualBeam
  • Multi-modal data acquisition (SEM, EDS, EBSD)
  • On-the-fly editing capabilities
  • Edge based cut placement

AutoTEM 5

  • Fully automated in situ S/TEM sample preparation
  • Support of top-down, planar and inverted geometry
  • Highly configurable workflow
  • Easy to use, intuitive user interface

AutoScript 4

  • improved reproducibility and accuracy
  • Unattended, high throughput imaging and patterning
  • Supported by Python 3.5-based scripting environment
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Electron microscopy services for
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To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.