Paint coating scratch test imaged on the Helios DualBeam
Site-specific cross-section for scratch testing and adhesion of a paint coating,
performed on a Helios G4 PFIB DualBeam.

Modern materials characterization is increasingly reliant on sub-surface characterization for a more comprehensive understanding of the material’s structure and physical properties. Cross-sectioning with a DualBeam instrument, which combines a focused ion beam with a scanning electron microscope (FIB-SEM), allows you to mill the material with FIB and perform high-resolution SEM imaging at nanometer scale. In failure analysis, for instance, this allows for defects to be located under the surface, making DualBeams instruments ideal for identification of the root cause of failures.

Along with high-resolution SEM imaging, cross-section characterization on the DualBeam can be expanded with back-scattered electron (BSE) imaging for maximum materials contrast, energy-dispersive X-ray spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) for microstructural and crystallographic information.

Additionally, with the introduction of the Thermo Scientific Helios Hydra DualBeam, we now offer the flexibility of argon, oxygen, xenon, and nitrogen ion species in one instrument, allowing you to choose the best FIB type for each of your experiments. Xenon ions are well suited for high-throughput removal of various materials, like metals and ceramics, whereas oxygen ions provide superior milling quality for carbon-based samples. In case extremely large volume characterization is needed, the Thermo Scientific Helios Laser PFIB System is an additional solution. It enables high-throughput cross-sectioning up to millimeter scale, as well as processing of materials that are typically challenging for ion beams (e.g. charging or beam sensitive samples). We combine these unique DualBeam capabilities with our versatile software solutions to bring you a range of workflows for advanced 3D characterization and high-resolution analysis at the nanometer scale.

Silicon sample cross section generated on the Helios DualBeam.
Curtain-free large-area cross section of a silicon sample performed on the Helios Hydra DualBeam in less than one minute. This process was completed without a protective capping layer, showcasing the high-quality round beam to achieve superior cross-section quality with the argon focused ion beam.
Carbon based material cross section generated with xenon and oxygen plasma FIB.
Comparison of cross-section quality when milled using different ion types. For carbon-based materials, the oxygen ion beam typically shows improved cut face quality, as is shown for this automotive oil filter casing (polymer/glass-fiber composite). Horizontal field width is 350 µm.
CuAgAl additive manufacting powder cross section prepared with the Scios DualBeam
Cross section of an additive manufacturing powder (CuAgAl) using the Scios DualBeam. EBSD map (inset) shows grains size distribution and orientation within the particle.
Solder bump cross section generated with a DualBeam for SEM imaging.
Large-area cross section of a solder bump completed in 15 minutes. The curtain-free, high-quality cut face is suitable for XHR (extreme high resolution) SEM imaging.
Silicon sample cross section generated on the Helios DualBeam.
Curtain-free large-area cross section of a silicon sample performed on the Helios Hydra DualBeam in less than one minute. This process was completed without a protective capping layer, showcasing the high-quality round beam to achieve superior cross-section quality with the argon focused ion beam.
Carbon based material cross section generated with xenon and oxygen plasma FIB.
Comparison of cross-section quality when milled using different ion types. For carbon-based materials, the oxygen ion beam typically shows improved cut face quality, as is shown for this automotive oil filter casing (polymer/glass-fiber composite). Horizontal field width is 350 µm.
CuAgAl additive manufacting powder cross section prepared with the Scios DualBeam
Cross section of an additive manufacturing powder (CuAgAl) using the Scios DualBeam. EBSD map (inset) shows grains size distribution and orientation within the particle.
Solder bump cross section generated with a DualBeam for SEM imaging.
Large-area cross section of a solder bump completed in 15 minutes. The curtain-free, high-quality cut face is suitable for XHR (extreme high resolution) SEM imaging.

Applications

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Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Oil and Gas

As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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Geological Research

Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.

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Products

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Helios Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging

Helios 5 DualBeam

  • Fully automated, high-quality, ultra-thin TEM sample preparation
  • High throughput, high resolution subsurface and 3D characterization
  • Rapid nanoprototyping capabilities

Helios G4 PFIB DualBeam

  • High throughput large volume subsurface and 3D characterization
  • High-quality Ga+ free TEM samples
  • Extreme high resolution SEM imaging
  • Advanced ease of use and automation capabilities

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

Auto Slice and View 4.0 Software

  • Serial sectioning for 3D STEM images
  • Imaging plus analytical data (EDS, EBSD)
  • On-the-fly editing capabilities
  • New algorithms – easier to use

AutoTEM 5

  • Highest quality S/TEM sample preparation
  • Complete in situ S/TEM sample preparation workflow
  • Fully automated in-situ sample preparation

AutoScript 4

  • improved reproducibility and accuracy
  • Unattended, high throughput imaging and patterning
  • Supported by Python 3.5-based scripting environment
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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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