Filters are commonplace in today’s society, and fulfill critical functions in industry and the household, ranging from air filters that give you clean, breathable air to water filters that ensure you have safe, potable tap water.

The key to high-performance filtration is the development of synthetic fibers. To optimize a filter’s design (so it continues to filter a broad range of dry or wet particulates over time), features like fiber diameter, density, and surface morphology all need to be thoroughly characterized and optimized.

Traditional methods for fiber analysis, such as optical microscopy and atomic force microscopy (AFM), are insufficient for this multi-modal analysis. Optical microscopy lacks the resolution necessary to accurately study nanofibers, whereas AFM is too slow and suffers from physical probe issues. These methods also rely on slow, manual measurement and data analysis.

Scanning electron microscopy (SEM), meanwhile, offers exceptional resolution capabilities, and allows you to automatically characterize multiple fibers at the same time. With the addition of leading automation software, critical filter parameters can be extracted rapidly and reliably. This minimizes the time spent using SEM in the lab, increasing development throughput as you can quickly and easily analyze fibers for filtration design.

Thermo Fisher Scientific offers a range of SEM instrumentation for fiber analysis. When combined with Thermo Scientific FiberMetric Software, accurate, automated measurement of micro- and nanofiber properties is possible.

Electrospun imaged with Phenom Desktop SEM.
Electrospun nanofibers on a paper substrate, imaged with a Phenom Desktop SEM.
Dust filter imaged with Phenom Desktop SEM.
Fibers from a dust filter imaged with a Phenom Desktop SEM.
Nanofiber nonwoven material imaged with Phenom Desktop SEM.
High-magnification image of polyamide nano-fiber-based nonwoven material prepared by electrospinning, imaged with a Phenom Desktop SEM.
Nonwoven polymer fibers imaged with Phenom Desktop SEM.
Nonwoven polymer fiber material prepared by melt blowing, imaged on a Phenom Desktop SEM.
Polyamide nonwoven material imaged with Phenom Desktop SEM.
Polyamide nano-fiber-based nonwoven material prepared by electrospinning, imaged on a Phenom Desktop SEM.
HEPA filter fibers imaged with Phenom Desktop SEM.
Fibers from a high-efficiency-particulate-air (HEPA) filter, imaged on a Phenom Desktop SEM.
Nanofiber nonwoven material imaged with Phenom Desktop SEM.
High-magnification image of polyamide nano-fiber-based nonwoven material prepared by electrospinning, imaged with a Phenom Desktop SEM.
Nonwoven polymer fibers imaged with Phenom Desktop SEM.
Nonwoven polymer fiber material prepared by melt blowing, imaged on a Phenom Desktop SEM.
Polyamide nonwoven material imaged with Phenom Desktop SEM.
Polyamide nano-fiber-based nonwoven material prepared by electrospinning, imaged on a Phenom Desktop SEM.
HEPA filter fibers imaged with Phenom Desktop SEM.
Fibers from a high-efficiency-particulate-air (HEPA) filter, imaged on a Phenom Desktop SEM.

Applications

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Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

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3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

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EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

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ColorSEM

Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.

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Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

ColorSEM

Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.

Learn more ›

Cross-sectioning

Cross sectioning provides extra insight by revealing sub-surface information. DualBeam instruments feature superior focused ion beam columns for high-quality cross sectioning. With automation, unattended high-throughput processing of samples is possible.

Learn more ›

Products

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Phenom Pharos Desktop SEM

  • FEG source with 2 up to 15 kV acceleration voltage range
  • <2.5 nm (SE) and <4.0 nm (BSE) resolution @ 15 kV; up to 1,000,000x magnification
  • Optional fully integrated EDS and SE detector

Phenom XL G2 Desktop SEM

  • For large samples (100x100 mm) and ideal for automation
  • <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage
  • Optional fully integrated EDS and BSE detector

Phenom Pro Desktop SEM

  • High performance desktop SEM
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector

Phenom ProX Desktop SEM

  • High performance desktop SEM with integrated EDS detector
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector
 
 

Phenom Pure SEM

  • Imaging module
  • 19” monitor
  • Diaphragm vacuum pump

Phenom ParticleX AM Desktop SEM

  • Versatile desktop SEM with automation software for Additive Manufacturing
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom ParticleX TC Desktop SEM

  • Versatile desktop SEM with automation software for Technical Cleanliness
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom Perception GSR Desktop SEM

  • Dedicated automated GSR desktop SEM
  • Resolution <10 nm; magnification up to 200,000x
  • Longlife CeB6 source

AsbestoMetric

  • Automated tool for image acquisition, fiber detection and reporting
  • Assisted EDS analysis with fiber revisiting
  • ISO standard report on asbestos analysis

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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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