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DPC imaging

Modern electronics research often relies on nanometer-scale characterization of electric and magnetic properties. Differential phase contrast STEM (DPC-STEM) is used to perform such tasks, allowing you to image the strength and distribution of magnetic fields in and around your sample, and directly display the magnetic domain structure. What makes this technique so valuable is its ability to directly image complex materials used in data storage and electronic devices.

Differential phase contrast microscopy

DPC-STEM has applications in a number of research areas. In the field of spintronics, it is often important to determine the micro-magnetic state of sub-micrometer patterned magnetic materials. In optoelectronics, quantum wells in non-centrosymmetric materials cause strong piezoelectric fields that modify the band structure of these devices. These spintronics and optoelectronics materials require thorough characterization to be fully understood, a capability unique to DPC-STEM.

The technique is not just limited to magnetic samples. Polarized materials and films exert a similar influence on the electron beam as materials containing an intrinsic electric field. DPC-STEM can reveal critical information on the charge distribution of bonds, across interfaces, and at surfaces, potentially leading to the discovery of new aspects of a material’s physical properties.

DPC-STEM is available on Thermo Scientific Talos S/TEM and Spectra S/TEM platforms with the four-segment design of the (Panther) STEM Detector. Combined with Thermo Scientific Velox Software, these instruments give you the option of live DPC acquisition that’s fully integrated into the user interface.


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Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.



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Spectra 300

  • Highest-resolution structural and chemical information at the atomic level
  • Flexible high-tension range from 30-300 kV
  • Three lens condenser system

Spectra 200

  • High-resolution and contrast imaging for accelerating voltages from 30-200 kV
  • Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sub-Angstrom STEM imaging resolution from 60 kV-200 kV

Talos F200X TEM

  • High-resolution, EDS cleanliness, and quality in 2D as well as 3D
  • X-FEG and X-CFEG available for the highest brightness and energy resolution
  • High accuracy and repeatable results with integrated Thermo Scientific Velox Software
Thermo Scientific Talos F200C transmission electron microscope (TEM)

Talos F200C TEM

  • High-contrast and high-quality TEM and STEM imaging
  • 4k x 4k Ceta CMOS camera options for large FOV and high read-out speeds
  • Large pole piece gap and multiple in situ options

Talos F200i TEM

  • Compact design with X-TWIN objective lens
  • Available with S-FEG, X-FEG, and X-CFEG
  • Flexible and fast EDS options for comprehensive elemental analysis

Talos F200S TEM

  • Intuitive and easy-to-use automation software
  • Available with Super-X EDS for rapid quantitative chemical analysis
  • High-throughput with simultaneous multi-signal acquisition
Thermo Scientific Talos L120C transmission electron microscope (TEM)

Talos L120C TEM

  • High versatility and stability
  • 4k x 4k Ceta CMOS camera for speed and large FOV
  • TEM magnification range of 25X to 650kX
  • EDS and STEM options for compositional analyses


  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control and setup

Avizo Software
Materials Science

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms
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Electron microscopy services for
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