Nanotechnology is quickly redefining how we live. In the textile industry, they’re leading to intelligent, adaptable clothing that better repels stains, odors, and water. Consumer electronics, such as smartphones and other devices we use on a daily basis, are powered by transistors that are becoming ever smaller, faster, and better thanks to nanotechnology. In medicine, nanoparticles are being developed to deliver next-generation drugs and vaccines. It even has applications in the energy sector, where it is improving the efficiency of solar and wind power.

The versatility of nanoparticles arises from the fact that atoms and molecules have fundamentally different properties at the nanoscale than when they are combined to form larger particles or bulk materials. Some are better at conducting electricity and heat. Some are stronger, have different magnetic properties, or better reflect light. Materials at the nanoscale also have far greater surface areas than bulk materials, allowing nanoparticles to act as chemical catalysts in industrial applications or in automotive catalytic converters.

Quantifying the composition, sizes and shapes of nanoparticles is a crucial first step in furthering our understanding of their unique properties. Using intuitive scanning or transmission electron microscopes (S/TEM) in combination with energy dispersive x-ray spectroscopy (EDX), researchers around the globe are obtaining nanometer-, and even sub-nanometer-, scale images and chemical data, giving important insights into the arrangement and potential functions of nanoparticles.

The need for large area correlative imaging at high resolution has recently increased, as it allows researchers to preserve the context of their observations while also providing statistically robust data. Thermo Scientific Maps Software enables automated, unattended acquisition of images across a sample that are then stitched together to create one large final image. Additionally, Thermo Scientific Avizo Software allows for on-the-fly processing of statistics such as size, surface area, perimeter, distribution, and chemical composition of nanoparticles. Images and chemical information from different microscopes can be correlated to retain relevant context.

Nanoparticles imaged with large area TEM.
Large-area TEM image of nanoparticles produced by a Thermo Scientific Talos TEM. In the subsequent image these particles are automatically analyzed and sorted according to size. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticle elemental composition determined with STEM-EDS
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.
Nanoparticles colored according to particle size with Avizo Software.
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticles imaged with STEM
STEM image of a collection of nanoparticles. In the subsequent image the elemental composition of individual particles is determined from EDS data which is acquired along with image acquisition. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.
Nanoparticles imaged with large area TEM.
Large-area TEM image of nanoparticles produced by a Thermo Scientific Talos TEM. In the subsequent image these particles are automatically analyzed and sorted according to size. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticle elemental composition determined with STEM-EDS
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.
Nanoparticles colored according to particle size with Avizo Software.
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticles imaged with STEM
STEM image of a collection of nanoparticles. In the subsequent image the elemental composition of individual particles is determined from EDS data which is acquired along with image acquisition. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno.

Applications

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Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

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Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

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EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

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Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

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Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

Particle analysis

Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.

Learn more ›

Products

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Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200X TEM

  • High resolution and throughput in STEM imaging and chemical analysis
  • Add application-specific in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Talos L120C

  • Increased stability
  • Multiple auto-functions
  • Quick sample exchange with robust vacuum system
  • High-quality cryo-imaging

Avizo Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control & set-up

Maps Software

  • Acquire high resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process
  • Correlate data from different sources

ParticleMetric

  • Integrated software in ProSuite for online and offline analysis
  • Correlating particle features such as diameter, circularity, aspect ratio and convexity
  • Creating image datasets with Automated Image Mapping

Elemental Mapping

  • Fast and reliable information on the distribution of elements within the sample or the selected line
  • Easily exported and reported results

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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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