The morphology, structure, shape, and size of particles play a vital role in their chemical and physical properties. This is particularly true for nanoparticles, which have fundamentally different physical characteristics from the corresponding materials in bulk (at the macro-scale). For example, the size of semiconductor nanoparticles can alter the frequency and wavelength of light they emit, making precise control of their dimensions vital for practical optoelectronic applications. Understanding the structural and chemical properties of these particles, and how they can be modified, requires accurate analysis that is only possible with tools such as electron microscopy.

Another example is additive manufacturing, which utilizes metal feed powders to produce finely engineered and designed components. The quality and consistency of the feed powder particles have a direct impact on the quality of the manufactured part. Chemical and physical characterization is necessary because variations in particle morphology and chemistry can lead to non-uniform layering, increased defects, and even catastrophic failures. On the other hand, precise visual study of these powders can lead to innovations and improvements in design, development, and quality control.

Thermo Fisher Scientific offers a range of microscopy solutions, along with advanced analysis software, to help you with particle characterization. Whatever your needs, we have hardware and software designed to deliver automated and accurate analysis on particles and feed powders.

Cobalt particle aggregate imaged with SEM
SEM image of a cobalt particle aggregate. Such SEM images can be analyzed and parametrized with a range of Thermo Fisher Scientific software workflows.
Nanoparticle elemental composition determined with STEM-EDS
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Data processing performed with Avizo Software. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno
Nanoparticles colored according to particle size with Avizo Software
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Cobalt particle aggregate imaged with SEM
SEM image of a cobalt particle aggregate. Such SEM images can be analyzed and parametrized with a range of Thermo Fisher Scientific software workflows.
Nanoparticle elemental composition determined with STEM-EDS
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Data processing performed with Avizo Software. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno
Nanoparticles colored according to particle size with Avizo Software
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.

Applications

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Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Aluminum mineral grain found with SEM during parts cleanliness testing

Cleanliness
 

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

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Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Automotive Materials Testing

Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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2D Materials

Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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Nanoparticles

Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Products

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Apreo SEM

  • High-performance SEM for all-round nanometer or sub-nanometer resolution
  • In-column T1 backscatter detector for sensitive, TV-rate materials contrast
  • Excellent performance at long working distance (10 mm)

Phenom Pharos Desktop SEM

  • FEG source with 2 up to 15 kV acceleration voltage range
  • <2.5 nm (SE) and <4.0 nm (BSE) resolution @ 15 kV; up to 1,000,000x magnification
  • Optional fully integrated EDS and SE detector

Phenom XL G2 Desktop SEM

  • For large samples (100x100 mm) and ideal for automation
  • <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage
  • Optional fully integrated EDS and BSE detector

Phenom Pro Desktop SEM

  • High performance desktop SEM
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector

Phenom ProX Desktop SEM

  • High performance desktop SEM with integrated EDS detector
  • Resolution <8 nm (SE) and <10 nm (BSE); magnification up to 150,000x
  • Optional SE detector
 
 

Phenom Pure SEM

  • Imaging module
  • 19” monitor
  • Diaphragm vacuum pump

Phenom ParticleX AM Desktop SEM

  • Versatile desktop SEM with automation software for Additive Manufacturing
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom ParticleX TC Desktop SEM

  • Versatile desktop SEM with automation software for Technical Cleanliness
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom Perception GSR Desktop SEM

  • Dedicated automated GSR desktop SEM
  • Resolution <10 nm; magnification up to 200,000x
  • Longlife CeB6 source

Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200X TEM

  • High resolution and throughput in STEM imaging and chemical analysis
  • Add application-specific in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Avizo Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control & set-up

Maps Software

  • Acquire high resolution images over large areas
  • Easily find regions of interest
  • Automate image acquisition process
  • Correlate data from different sources

ParticleMetric

  • Integrated software in ProSuite for online and offline analysis
  • Correlating particle features such as diameter, circularity, aspect ratio and convexity
  • Creating image datasets with Automated Image Mapping

Elemental Mapping

  • Fast and reliable information on the distribution of elements within the sample or the selected line
  • Easily exported and reported results

Nebula Particle Disperser

  • Standard method for uniform dry powder dispersion
  • Avoids particle clusters
  • Used with Phenom Desktop SEM
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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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