Modern industrial processes require high throughput for cost-effective production. This pace is metered by the need for quality, reliability, and consistency in the final product. Process control, therefore, seeks to optimize and regulate production to strike a balance between output and quality. Monitoring of various parameters, such as size, morphology, and impurities, must be as efficient as possible to minimize the impact of the analysis on overall production time. Additionally, observations must be highly reliable to ensure that process adjustments are based on the true characteristics of the sample.

Despite the highly versatile and valuable data that can be obtained on electron microscopes (EM), these instruments have historically been impractical for process control applications due to the need for manual operation. Today, with the advent of dedicated tools and automated software, EM is becoming a vital part of production monitoring and analysis. Chemical, as well as structural, information can even be acquired by coupling energy-dispersive X-ray spectroscopy (EDS) with EM imaging within the same instrument.

Scanning electron microscopy (SEM) tools are capable of automatically visualizing, quantifying, and reporting on sub-micron to nanometer-scale particles, inclusions, and faults that fundamentally impact product quality. For even greater detail, transmission electron microscopes (TEM) are able to observe and characterize sub-nanoscale features, such as the structural and elemental composition of nanoparticles. This rapid analysis, performed in a matter of minutes, produces actionable, robust statistics on key sample parameters for critical process control and improvement. Finally, if sub-surface information is needed, DualBeam (focused ion beam and SEM) tools are capable of probing into samples through alternating surface milling and imaging, providing 3D information such as layer thickness.

Thermo Fisher Scientific offers a range of hardware and software solutions dedicated to process control applications. Follow the links below for additional information.

Additive manufacturing powder imaged with SEM
Additive manufacturing powder imaged with SEM. Morphological classification, to separate particles and agglomerates, can subsequently be performed in analysis software.
Nanoparticle analysis plot showing the distribution of particle sizes
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as a collection of nanoparticles. Here, the subsequent data analysis reveals the distribution of particle diameter. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticles imaged with TEM
Large-area TEM image of nanoparticles produced by a Thermo Scientific Talos TEM. In the subsequent image these particles are automatically analyzed and sorted according to size. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticles imaged with TEM.
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Additive manufacturing powder imaged with SEM
Additive manufacturing powder imaged with SEM. Morphological classification, to separate particles and agglomerates, can subsequently be performed in analysis software.
Nanoparticle analysis plot showing the distribution of particle sizes
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as a collection of nanoparticles. Here, the subsequent data analysis reveals the distribution of particle diameter. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticles imaged with TEM
Large-area TEM image of nanoparticles produced by a Thermo Scientific Talos TEM. In the subsequent image these particles are automatically analyzed and sorted according to size. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Nanoparticles imaged with TEM.
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.

Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Nanoparticles

Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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2D Materials

Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging.

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Automotive Materials Testing

Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.

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S/TEM Sample Preparation

DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for S/TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials.

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3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

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EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

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ColorSEM

Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.

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Environmental SEM (ESEM)

Environmental SEM allows materials to be imaged in their native state. This is ideally suited for academic and industrial researchers who need to test and analyze samples that are wet, dirty, reactive, outgassing or otherwise not vacuum compatible.

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In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

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Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

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S/TEM Sample Preparation

DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for S/TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

EDS Elemental Analysis

EDS provides vital compositional information to electron microscope observations. In particular, our unique Super-X and Dual-X Detector Systems add options for enhanced throughput and/or sensitivity, allowing you to optimize data acquisition to meet your research priorities.

Learn more ›

ColorSEM

Using live EDS (energy dispersive X-ray spectroscopy) with live quantification, ColorSEM Technology transforms SEM imaging into a color technique. Any user can now acquire elemental data continuously for more complete information than ever before.

Learn more ›

Environmental SEM (ESEM)

Environmental SEM allows materials to be imaged in their native state. This is ideally suited for academic and industrial researchers who need to test and analyze samples that are wet, dirty, reactive, outgassing or otherwise not vacuum compatible.

Learn more ›

In Situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Learn more ›

Multi-scale analysis

Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.

Learn more ›

Products

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Helios Hydra DualBeam

  • 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials
  • Ga-free TEM sample preparation
  • Extreme high resolution SEM imaging

Helios G4 PFIB DualBeam

  • High throughput large volume subsurface and 3D characterization
  • High-quality Ga+ free TEM samples
  • Extreme high resolution SEM imaging
  • Advanced ease of use and automation capabilities

Helios 5 DualBeam

  • Fully automated, high-quality, ultra-thin TEM sample preparation
  • High throughput, high resolution subsurface and 3D characterization
  • Rapid nanoprototyping capabilities

Scios 2 DualBeam

  • Full support of magnetic and non-conductive samples
  • High throughput subsurface and 3D characterization
  • Advanced ease of use and automation capabilities

Talos L120C TEM

  • Increased stability
  • 4k × 4K Ceta CMOS camera
  • TEM magnification range from 25 – 650 k×
  • Flexible EDS analysis reveals chemical information

Talos F200i TEM

  • High-quality S/TEM images and accurate EDS
  • Available with dual EDS technology
  • Best all-round in situ capabilities
  • Large field-of-view imaging at high speed

Talos F200S TEM

  • Precise chemical composition data
  • High performance imaging and precise compositional analysis for dynamic microscopy
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200X TEM

  • High resolution and throughput in STEM imaging and chemical analysis
  • Add application-specific in situ sample holders for dynamic experiments
  • Features Velox Software for fast and easy acquisition and analysis of multimodal data

Talos F200C TEM

  • Flexible EDS analysis reveals chemical information
  • High-contrast, high-quality TEM and STEM imaging
  • Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed

Quattro ESEM

  • Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM)
  • Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation

Prisma E SEM

  • Entry-level SEM with excellent image quality
  • Easy and quick sample loading and navigation for multiple samples
  • Compatible with a wide range of materials thanks to dedicated vacuum modes

Phenom ParticleX AM Desktop SEM

  • Versatile desktop SEM with automation software for Additive Manufacturing
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom ParticleX TC Desktop SEM

  • Versatile desktop SEM with automation software for Technical Cleanliness
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

HeliScan microCT

  • Advanced helical scanning and iterative reconstruction technology
  • High resolution x-ray source (below 400 nm)
  • Process, analyze, and visualize samples

Avizo Software

  • Support for multi-data/multi-view, multi-channel, time series, very large data
  • Advanced multi-mode 2D/3D automatic registration
  • Artifact reduction algorithms

Velox

  • An experiments panel on the left side of the processing window.
  • Live quantitative mapping
  • Interactive detector layout interface for reproducible experiment control & set-up

ParticleMetric

  • Integrated software in ProSuite for online and offline analysis
  • Correlating particle features such as diameter, circularity, aspect ratio and convexity
  • Creating image datasets with Automated Image Mapping

FiberMetric

  • Save time by automated measurements
  • Fast and automated collection of all statistical data
  • View and measure micro and nano fibers with unmatched accuracy

AsbestoMetric

  • Automated tool for image acquisition, fiber detection and reporting
  • Assisted EDS analysis with fiber revisiting
  • ISO standard report on asbestos analysis

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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.

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