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Scanning electron microscopes that bring research and engineering challenges into focus
No matter what you want to achieve, our scanning electron microscopes (SEMs) provide exceptional power and precision at your fingertips—whether you’re new to the technique or you have decades of experience. They also go beyond the microscope by creating synergy between several techniques, where elemental, particle, or structural analyses are seamlessly integrated into the instruments to add a new dimension to your research.
Next-level SEM imaging and analysis
Conduct a greater quantity of different sample analyses and techniques—with higher quality. Our systems push the boundaries of traditional SEM technology in terms of the high resolution and crystal-clear image quality you can expect.
Reliable scanning electron microscopy results
Be more confident in your analyses with efficient, smart, dedicated technologies that deliver consistently reliable results that you can trust—at high speed. Now you can analyze and interpret data more efficiently and turn this into meaningful and actionable insights.
Greater efficiency and productivity
Our SEMs are easy to use, automating a variety of both routine and complex tasks. This not only helps to boost your productivity and save valuable time, it also enables a greater number of users to get more from the microscope.
Multi-purpose scanning electron microscopes
If you need a general research SEM microscope that does all the heavy lifting for you by providing outstanding magnification with minimal manual intervention, you’re in the right place. The type of model best suited to your needs will depend on the samples you’re working with. Rest assured; we have a solution to meet your requirements.
Thermo Scientific Phenom Pure, Pro(X) G6 Desktop SEMThese all-round desktop SEMs are economical, easy-to-use, and they deliver high-quality images within minutes.
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 Thermo Scientific Phenom XL G2 Desktop SEMAnalyze large samples for extensive and high-throughput analysis with average time-to-image of just 60 seconds.
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Thermo Scientific Axia ChemiSEM SystemThis SEM with fully integrated EDS capability and an increased level of automation improves your throughput with better results and minimum effort. |
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| Source type | Cerium hexaboride (CeB6) source | Cerium hexaboride (CeB6) source | Tungsten (W) source |
| Max. resolution | <15 nm for Pure and ≤ 6 nm for Pro(X) | <10 nm | 3 nm |
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| Footprint | 92.5 (w) x 305.6 (d) x 343.5 (h)mm, 57.5 kg |
93 (w) x 293 (d) x 290 (h) mm, 82 kg |
895 (w) x 775 (d) x 1624 (h) mm, 405 kg |
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High-resolution scanning electron microscopes
These powerful scanning electron microscopes deliver nanometer-level resolution (even sub-nanometer in some cases) for a wide range of sample types including insulators and sensitive or magnetic samples. Best of all, you can achieve this with minimal effort thanks to automated and reliable alignments in addition to the integrated detectors and software that broaden your analytical horizons.
 Thermo Scientific Phenom Pharos G2 Desktop FEG-SEMThe world’s first desktop SEM with a field emission gun (FEG), giving you optimal image quality in a small-footprint system.
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 Thermo Scientific Apreo ChemiSEM System
This outstanding SEM with integrated EDS and EBSD brings you all-round nanometer resolution at analytical working distance (10 mm).
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 Thermo Scientific Verios 5 XHR SEMOur highest-performance SEM is ideal for characterization of nanomaterials with sub-nanometer resolution and high material contrast.
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| Source type | Schottky field emission source (FEG) | Schottky field emission source (FEG) | Schottky field emission source (FEG) |
| Max. resolution | <2.0 nm | 0.7 nm | 0.6 nm |
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| Footprint | 92.5 (w) 305.6 (d) 343.5 (h) mm, 84 kg |
890 (w) x 1368 (d) x 1874 (h) mm, 770 kg | 940 (w) x 1260 (d) x 1948 (h) mm, 895 kg |
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Variable pressure scanning electron microscopes
Observing and analyzing samples in their natural or hydrated state without requiring extensive preparation or altering their characteristics has traditionally been a challenge—but not with our environmental SEMs. They give you full control over the chamber pressure, unlocking the potential to study material interactions under relevant conditions in real time. Now you can conduct dynamic, in situ experiments at high resolution, without introducing artifact in your materials—and with minimal sample preparation.
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Thermo Scientific Quattro ESEM |
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| Source type | Tungsten (W) source | Schottky field emission source (FEG) |
| Max. resolution | 3 nm | 0.8 nm |
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| Footprint | 890 (w) x 1268 (d) x 1640 (h) mm, 550 kg |
890 (w) x 1368 (d) x 1768 (h) mm, 800 kg |
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Automation solutions for scanning electron microscopes
With these powerful, quality-control workhorses, you simply put the samples into the system and receive a concise, industrial-standard report out, powered by our integrated Thermo Scientific Perception Software. Each of our Thermo Scientific Phenom ParticleX Desktop SEMs is custom designed for a range of challenging materials, including additive manufacturing powders, industrial cleanliness, steel (both during and post-production), battery cathode powder, and gunpowder residue.
For Research Use Only. Not for use in diagnostic procedures.