SEM XPS | Surface Analysis | Thermo Fisher Scientific

Correlative Imaging and Surface Analysis Workflow

Combining X-ray photoelectron spectroscopy and SEM imaging for a more complete understanding of your materials.

Harness the combined powers of SEM and XPS

Obtaining a comprehensive understanding of a sample often requires analysis using multiple instruments. While scanning electron microscopy (SEM) imaging and energy dispersive X-ray spectroscopy (EDX) can provide composition information, they may not capture the surface chemistry critical for assessing material performance. Conversely, X-ray photoelectron spectroscopy (XPS) can reveal surface chemistry, but additional high-resolution imaging may be necessary to elucidate the intricate relationship between chemistry and structure and its impact on material behavior.

What if you could harness the combined powers of SEM and XPS?

With the Thermo Scientific CISA (Correlative Imaging and Surface Analysis) Workflow, you can seamlessly merge datasets from our XPS and SEM instruments, enabling deeper insights into your samples.

How to correlate SEM and XPS

The CISA Workflow integrates XPS with SEM analysis, providing precise quantitative chemical composition data alongside structural information from microscope imagery. This integration is valuable for studying surface and interface reactions, which is crucial in material research across diverse areas such as batteries, polymers, catalysts, metals, coatings, and packaging.

The CISA Workflow utilizes point-of-interest images to establish connections between XPS and SEM data. This enables precise targeting of identical positions on each sample during system transitions. Additionally, dataset alignment can be effortlessly confirmed through images, ensuring that data from both systems was collected at the same position for enhanced accuracy.

The dynamic CISA Workflow offers reliable high performance and accuracy between two surface analysis techniques, giving you a competitive edge in research.

X-Ray Photoelectron Spectroscopy Learning Center

XPS surface analysis references and resources

Learn more

SEM XPS webinars

Harness the combined powers of SEM and XPS

On-demand

Speaker: Robin Simpson, Thermo Fisher Scientific

In this on-demand demonstration session, you can witness firsthand the benefits of combining the powers of scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).

With improved sample transfer precision, you can now effortlessly target specific points of interest, ensuring enhanced data correlation between XPS and SEM tools for comprehensive surface analysis.

Attend the webinar to learn more about:
Transferring the sample to the SEM to get high-resolution imaging of the same positions
Analyzing points of interest with XPS to identify and quantify the surface chemistry
Combining everything in Maps software to have a complete view of the sample

Watch now

SEM XPS learning resources

Our learning resources offer valuable information and insights on the principles, techniques, and applications of XPS and surface analysis.

Combining correlative imaging and surface analysis

Gaining a comprehensive understanding of a sample often necessitates analysis using multiple instruments. While scanning electron microscopy (SEM) imaging and energy dispersive X-ray spectroscopy (EDS) can provide composition information, they may not uncover the surface chemistry crucial for understanding material performance. Conversely, knowledge of surface chemistry may require additional high-resolution imagery to fully comprehend the impact of the interplay between chemistry and structure on material behavior.

Explore now