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Materials Science
3D Electron Microscopy
3D electron microscopy through focused ion beam milling and scanning electron microscopy imaging.
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3D electron microscopy
Whether studying new materials or attempting to find the root causes of failures, highly localized characterization of increasingly complex samples with ever-smaller features is becoming increasingly critical. In fact, sub-surface or three-dimensional characterization is often required to fully understand the material properties of a sample. This can be particularly useful for heterogeneous materials or the detection and characterization of inclusions and precipitates. DualBeam (focused ion beam – scanning electron microscopy, FIB-SEM) instrumentation enables the acquisition of high-quality 3D datasets, at nanometer resolution, by serial sectioning (sequential application of SEM imaging and FIB milling).
Plasma FIB (PFIB)
Often, large volumes, which are inaccessible with conventional gallium FIB instruments, are necessary to obtain representative and statistically relevant results due to the additional contextual information a large sample provides. Plasma FIB instruments, such as the Thermo Scientific Helios 5 PFIB DualBeam and the Thermo Scientific Helios Hydra DualBeam, offer excellent high-current performance enabling fully automated, high-quality, large-volume 3D datasets in a variety of modalities. Additionally, the multiple ion source technology of the Helios Hydra DualBeam allows you to choose the best ion source for each particular sample and use case.
Plasma FIB serial sectioning can provide information on materials contrast (with backscattered electron imaging), compositional information (with energy dispersive spectroscopy), and microstructural and crystallographic information (with electron backscatter diffraction). This data can then be visualized with Thermo Scientific Avizo Software, delivering a unique workflow solution for the highest-resolution, advanced 3D characterization and analysis at the nanometer scale.
Laser PFIB
The Thermo Scientific Helios 5 Laser PFIB System goes beyond regular plasma FIB to perform cross-sectioning and 3D characterization of even larger volumes, up to millimeter-scale (with >15,000x faster coarse material removal as compared to gallium FIB). It also facilitates the processing of materials that are typically challenging for ion beam milling, such as charging and beam sensitive materials, with minimal damage.
3D EBSD reconstruction of a zircalloy sample (250 x 250 x 220 μm³) produced with the Helios PFIB DualBeam, Auto Slice & View 4 Software, and Avizo Software.
Large volume femto-second laser tomography of a carbon-fiber reinforced composite acquired with Laser PFIB on the Helios DualBeam. Horizontal field width is 500 µm.
Large-area cross-section of a steel sample manufactured by selective laser melting technology. Total milling time by laser is <5 minutes (area: 600 x 350 µm). Femto-second laser processing results in high-quality cut face, which directly allows EBSD mapping without the need for post-cleaning with FIB.
Automotive paint scratch testing. High throughput, large-scale cross-sectional imaging was performed with the Helios Plasma FIB DualBeam.
3D reconstruction of W-Mo-Cu sample using a combination of BSE (green-blue) and EDS (orange) data, which has been produced with a Thermo Scientific Scios 2 DualBeam System, Auto Slice and View 4 and Avizo for Materials Science software.
Automotive oil filter casing (a polymer/glass fiber composite) imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Avizo Software. Horizontal field width is 350 µm.
Embedded tissue sample imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Amira Software, highlighting the ability of the Helios Hydra DualBeam to perform high-quality 3D characterization of organic materials.
Large volume femto-second laser tomography of a carbon-fiber reinforced composite acquired with Laser PFIB on the Helios DualBeam. Horizontal field width is 500 µm.
Large-area cross-section of a steel sample manufactured by selective laser melting technology. Total milling time by laser is <5 minutes (area: 600 x 350 µm). Femto-second laser processing results in high-quality cut face, which directly allows EBSD mapping without the need for post-cleaning with FIB.
Automotive paint scratch testing. High throughput, large-scale cross-sectional imaging was performed with the Helios Plasma FIB DualBeam.
3D reconstruction of W-Mo-Cu sample using a combination of BSE (green-blue) and EDS (orange) data, which has been produced with a Thermo Scientific Scios 2 DualBeam System, Auto Slice and View 4 and Avizo for Materials Science software.
Automotive oil filter casing (a polymer/glass fiber composite) imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Avizo Software. Horizontal field width is 350 µm.
Embedded tissue sample imaged on the Helios Hydra DualBeam and reconstructed into a 3D volume in Amira Software, highlighting the ability of the Helios Hydra DualBeam to perform high-quality 3D characterization of organic materials.
Qualitätskontrolle und Fehleranalyse
Qualitätskontrolle und Qualitätssicherung sind in der modernen Industrie von entscheidender Bedeutung. Wir bieten eine Reihe von EM- und Spektroskopiegeräten für die mehrskalige und multimodale Analyse von Mängeln, mit denen Sie zuverlässige und fundierte Entscheidungen für die Kontrolle und Verbesserung von Prozessen treffen können.
Grundlagenforschung in der Materialforschung
Neuartige Materialien werden in immer kleineren Dimensionen untersucht, um ihre physikalischen und chemischen Eigenschaften bestmöglich zu kontrollieren. Die Elektronenmikroskopie gibt Forschern wichtige Einblicke in eine Vielzahl von Materialeigenschaften auf der Mikro- bis Nanoebene.
Batterieforschung
Die Entwicklung von Batterien wird durch die Multiskalen-Analyse mit Mikro-CT, REM und TEM, Raman-Spektroskopie, XPS und digitaler 3D-Visualisierung und 3D-Analyse ermöglicht. Erfahren Sie, wie dieser Ansatz die strukturellen und chemischen Informationen liefert, die für den Bau besserer Batterien benötigt werden.
Polymerforschung
Die Mikrostruktur von Polymeren bestimmt die Eigenschaften und die Leistungsfähigkeit des Materials. Die Elektronenmikroskopie ermöglicht eine umfassende Analyse der Morphologie und Zusammensetzung von Polymeren im Mikroskalenbereich für Anwendungen in der F+E und Qualitätskontrolle.
Metallforschung
Die effektive Produktion von Metallen erfordert eine präzise Kontrolle von Einschlüssen und Ausscheidungen. Unsere automatisierten Geräte können eine Vielzahl von Aufgaben ausführen, die für die Metallanalyse wichtig sind, einschließlich der Zählung von Nanopartikeln, der chemischen Analyse mittels EDS und der Vorbereitung von TEM-Proben.
Öl und Gas
Da die Nachfrage nach Öl und Gas anhält, besteht ein ständiger Bedarf an einer effizienten und effektiven Gewinnung von Kohlenwasserstoffen. Thermo Fisher Scientific bietet eine Reihe von Mikroskopie- und Spektroskopielösungen für eine Vielzahl von Anwendungen in der Petrochemie an.
Fasern und Filter
Durchmesser, Morphologie und Dichte synthetischer Fasern sind wichtige Parameter, die die Lebensdauer und Funktionalität eines Filters bestimmen. Die Rasterelektronenmikroskopie (REM) ist die ideale Technologie für die schnelle und einfache Untersuchung dieser Merkmale.
Geologische Forschung
Die Geowissenschaften beruhen auf einer konsistenten und präzisen, mehrskaligen Beobachtung von Merkmalen in Gesteinsproben. Die REM-EDS ermöglicht in Kombination mit Automatisierungssoftware eine direkte, umfangreiche Analyse der Textur und Mineralzusammensetzung für die petrologische und mineralogische Forschung.
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