About Adam Stokes
Adam Stokes is a Senior Product Marketing Manager with 13 years of experience in electron microscopy. His technical expertise centers on plasma focused ion beam (PFIB) techniques for advanced failure analysis, as well as millimeter-to-nanoscale device characterization and the identification of critical microstructure–property relationships. He holds a PhD in Materials Science from the Colorado School of Mines.
Expertise and focus
Adam’s expertise centers on PFIB workflows used in semiconductor failure analysis and advanced device characterization. His background includes large volume material removal, cross sectioning, advanced lamella preparation, and three-dimensional analysis applied to complex semiconductor structures. He has worked with a range of preparation techniques that support downstream analysis such as transmission electron microscopy and atom probe tomography, enabling detailed investigation of defects, interfaces, and process-related variations in semiconductor devices.
Scientific perspective
Adam’s scientific perspective is shaped by his doctoral research in materials science together with his ongoing engagement with semiconductor characterization challenges. He understands how plasma focused ion beam methods can be used to access buried features and complex architectures at relevant length scales, and how these capabilities support yield learning, process development, and device reliability analysis. His work reflects a focus on connecting advanced preparation and analysis techniques with the evolving needs of semiconductor technology development.
