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The American Vacuum Society (AVS) is hosting its 72nd International Symposium and Exhibition, and we’ll be there. Visit us in booth 309 for remote demos of our XPS instruments and an opportunity to discuss your materials analysis challenges with our team.
Best of all, you’ll have the opportunity to discover the Thermo Scientific™ Hypulse™ Surface Analysis System, combining femtosecond laser ablation with the Thermo Scientific™ MAGCIS Ion Source for advanced depth profiling. Join us to see how the Hypulse System can help transform materials analysis and unlock new possibilities for your research.
If you’re planning to attend, be sure to catch our surface analysis presentations and book an appointment with our team to discuss how the latest instruments and techniques can support your work.
XPS depth profiling of multilayer stacks using femtosecond laser ablation (fs-LA)
Wednesday, November 11
8:15 to 8:30 a.m.
Presented by Charlie Chandler, University of Surrey
Calibration of removal rates for fs-laser ablation XPS depth profiling
Wednesday, November 11
8:30 to 8:45 a.m.
Presented by Dr. Tim Nunney, Thermo Fisher Scientific
Multimodal surface analysis and depth profiling using femtosecond laser ablation, ion sputtering, and ion scattering spectroscopy
Wednesday, November 11
11:00 to 11:15 a.m.
Presented by Dr. Paul Mack, Thermo Fisher Scientific
Correlative imaging and surface analysis of air-sensitive materials
Thursday, November 12
3:45 to 4:00 p.m.
Presented by Dr. Lu Ping, Thermo Fisher Scientific
Tackle your surface analysis challenges with help from our XPS learning center.