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September 21 - 26 | Charlotte, North Carolina
The American Vacuum Society (AVS) is hosting its 71st annual International Symposium & Exhibition, and we’ll be there. Visit us in booth 601 for remote demos of our XPS instruments and an opportunity to discuss your materials analysis challenges with our team.
Best of all, we’re going to introduce our new surface analysis system, which is equipped with both femtosecond laser ablation and the Thermo Scientific MAGCIS Ion Source for depth profiling. Join us to be the first to see how it can help you revolutionize materials analysis.
NEW: fs-LA Surface Analysis System
XPS tool with femtosecond laser ablation and MAGCIS ion source for depth profiling.
Thermo Scientific Nexsa G2 Surface Analysis System
X-ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities.
Thermo Scientific ESCALAB QXi XPS Microprobe
Multi-technique surface analysis instrument with high-resolution X-ray photoelectron spectroscopy and imaging.
Thermo Scientific K-Alpha X-Ray Photoelectron Spectrometer
X-ray photoelectron spectrometer for high-performance surface analysis.
Book your demo today!
New developments for surface analysis from Thermo Fisher Scientific
Presented by: Tim Nunney | 09/23 10:15 a.m. | Exhibition Hall A,
Presentation Area
Affiliation: Thermo Fisher Scientific
Join us on the exhibition floor to hear Tim Nunney, our applications development and marketing manager, introduce our new femtosecond laser ablation XPS system.
Routine, integrated Ag-Lα HAXPES acquisition and quantification
Presented by: Miroslav Michlíček | 09/22 2:15 p.m. | Room 209 B W
Affiliation: Thermo Fisher Scientific
Correlative XPS and EBSD with cluster ion etching for enhanced surface preparation
Presented by: Simon Bacon | 09/22 3:15 p.m. | Room 209 B W
Affiliation: Thermo Fisher Scientific
Enhanced depth profiling of polymer multi-layer samples using combined femtosecond laser ablation and cluster ion beams in XPS
Presented by: Robin Simpson | 09/22 3:30 p.m. | Room 209 B W
Affiliation: Thermo Fisher Scientific
Femtosecond laser ablation (fs-LA) XPS depth profiling of lead halide perovskite thin-film solar cells for space applications
Presented by: Charlie Chandler | 09/23 9:15 a.m. | 206 B W
Affiliation: University of Surrey
Femtosecond laser ablation (fs-LA) XPS depth profiling for surface engineering
Presented by: Mark Baker | 09/24 11:30 a.m. | 209 F W
Affiliation: University of Surrey
Effect of pulse duration and multi-shot ablation in femtosecond laser ablation (fs-LA) XPS depth profiling of indium phosphide
Presented by: Charlie Chandler | 09/25 4:30–7:00 p.m. | Applied Surface Science Poster Session, Ballroom BC
Affiliation: University of Surrey
Applications of femtosecond laser ablation (fs-LA) XPS depth profiling
Presented by: Mark Baker | 09/25 4:30–7:00 pm | Applied Surface Science Poster Session, Ballroom BC
Affiliation: University of Surrey