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Explore XPS for surface analysis
Are you ready to explore advanced capabilities of X-ray Photoelectron Spectroscopy (XPS) for surface analysis? Join us for an exclusive webinar where Robin Simpson, EngD, an esteemed application scientist from Thermo Fisher Scientific, will present the Thermo Scientific™ Nexsa™ G2 XPS System.
In this webinar, you will learn how the Nexsa G2 system integrates multiple complementary techniques to provide comprehensive surface analysis. This system enhances high performance, high throughput, and usability with advanced capabilities such as Raman spectroscopy, UPS, and ISS, making it a versatile tool for material scientists.
What You Will Learn
- Introduction to Nexsa G2 XPS System: Discover the unique features and capabilities that set the Nexsa G2 apart.
- Multi-technique analysis: Learn how the Nexsa G2 integrates Raman spectroscopy, UPS, ISS, and more for comprehensive surface analysis.
- Advanced applications: Explore case studies demonstrating the system's application in analyzing complex material surfaces.
- User-friendly operation: Understand how the automated workflows and the Avantage software streamline the analysis process.
Don't miss this opportunity to enhance your knowledge and expertise in surface analysis with the Nexsa G2 XPS System. Fill out the registration form to gain exclusive access to this informative webinar.
About the speaker
Robin Simpson, Application Scientist, Thermo Fisher Scientific
Robin Simpson is one of the application scientists in the surface analysis team at Thermo Fisher Scientific. In this role, Robin is involved in system demonstrations, customer training, and the production of marketing content for the surface analysis products. He had close links to the team for four years while undertaking his engineering doctorate at the University of Surrey and he officially joined the team in 2017. His thesis involved the investigation of the effects of Ar cluster depth profiling on varied material surfaces using the MAGCIS ion source.